Focus Session: Graphene Devices: Function, Fabrication, and Characterization: Graphene Surface Characterization

Presentations

• High Resolution Imaging of Graphene on SiC by Contact Resonance AFM: Experiment and Theory

  ORAL

  March 5, 2015, 2:30 PM – March 5, 2015, 2:42 PM

  Authors

  • Qing Tu

    • Department of Mechanical Engineering and Materials Science, Duke University, Durham, NC, USA

  • Bjoern Lange

    • Department of Mechanical Engineering and Materials Science, Duke University, Durham, NC, USA

  • Joao Marcelo Lopes

    • Paul-Drude-Institut f\"ur Festk\"orperelektronik, Hausvogteiplatz 5-7, D-10117 Berlin, Germany

  • Stefan Zauscher

    • Department of Mechanical Engineering and Materials Science, Duke University, Durham, NC, USA

  • Volker Blum

    • Duke University
    • Department of Mechanical Engineering and Materials Science, Duke University, Durham, NC, USA
    • Department of Mechanical Engineering and Material Science, Duke University, Durham, NC, USA
    • Fritz-Haber-Institut der MPG, Berlin, DE; Duke University, Durham, NC, USA

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• Charging Ring Spectroscopy and Defect Identification in Graphene/Boron Nitride Through Scanning Tunneling Microscopy

  ORAL

  March 5, 2015, 2:42 PM – March 5, 2015, 2:54 PM

  Authors

  • Juwon Lee

    • Univ of California - Berkeley

  • Dillon Wong

    • Univ of California - Berkeley

  • Jairo Valesco

    • Univ of California - Berkeley

  • Long Ju

    • Univ of California - Berkeley

  • Salman Kahn

    • Univ of California - Berkeley

  • Hsinzon Tsai

    • Univ of California - Berkeley

  • Chad Germany

    • Univ of California - Berkeley

  • Takashi Taniguchi

    • National Institute for Material Science

  • Kenji Watanabe

    • National Institute for Material Science

  • Alex Zettl

    • Univ of California - Berkeley

  • Feng Wang

    • Univ of California - Berkeley

  • Michael Crommie

    • Univ of California - Berkeley

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• Scanning tunneling microscopy studies of graphene and hydrogenated graphene on Cu(111)

  ORAL

  March 5, 2015, 2:54 PM – March 5, 2015, 3:06 PM

  Authors

  • Shawna M. Hollen

    • The Ohio State University

  • Grady Gambrel

    • The Ohio State University

  • Steven Tjung

    • The Ohio State University

  • Nancy M. Santagata

    • The Ohio State University

  • Ezekiel Johnston-Halperin

    • The Ohio State University
    • The Ohio State University, Dept of Physics
    • The Ohio Sate University
    • Ohio State Univ - Columbus

  • Jay A. Gupta

    • The Ohio State University

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• ABSTRACT WITHDRAWN

  March 5, 2015, 3:06 PM – March 5, 2015, 3:18 PM

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• Probing Graphene by Low-Energy Electrons under Non-normal Incidence

  ORAL

  March 5, 2015, 3:18 PM – March 5, 2015, 3:30 PM

  Authors

  • Johannes Jobst

    • Leiden University, Huygens-Kamerlingh Onnes Laboratory
    • Leiden University, Kamerlingh Onnes Laboratory, 2300RA Leiden, The Netherlands

  • Jaap Kautz

    • Leiden University, Huygens-Kamerlingh Onnes Laboratory
    • Leiden University, Kamerlingh Onnes Laboratory, 2300RA Leiden, The Netherlands

  • Daniel Geelen

    • Leiden University, Huygens-Kamerlingh Onnes Laboratory

  • Rudolf Tromp

    • IBM T.J. Watson Research Center
    • IBM T J Watson Res Ctr
    • IBM Research Division

  • Sense Jan van der Molen

    • Leiden University, Huygens-Kamerlingh Onnes Laboratory
    • Leiden University, Kamerlingh Onnes Laboratory, 2300RA Leiden, The Netherlands

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• Resonant Modes in Circular Graphene \textit{pn} Junctions Created by STM Probes

  ORAL

  March 5, 2015, 3:30 PM – March 5, 2015, 3:42 PM

  Authors

  • Jonathan Wyrick

    • Center for Nanoscale Science and Technology NIST
    • National Institute of Standards and Technology

  • Yue Zhao

    • Center for Nanoscale Science and Technology NIST; Maryland NanoCenter UMD

  • Fabian Natterer

    • Center for Nanoscale Science and Technology NIST

  • Joaquin Rodriguez Nieva

    • Department of Physics, Massachusetts Institute of Technology

  • Cyprian Lewandowski

    • Department of Physics, Imperial College London

  • Kenji Watanabe

    • National Institute for Materials Science

  • Takashi Taniguchi

    • National Institute for Materials Science

  • Leonid Levitov

    • Department of Physics, Massachusetts Institute of Technology

  • Nikolai Zhitenev

    • Center for Nanoscale Science and Technology NIST

  • Joseph Stroscio

    • Center for Nanoscale Science and Technology NIST
    • National Institute of Standards and Technology

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• Stacking defects and transport in bilayer graphene

  COFFEE_KLATCH · Invited

  March 5, 2015, 3:42 PM – March 5, 2015, 4:18 PM

  Authors

  • Francisco Guinea

    • CSIC

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• Examination of Humidity Effects on Measured Thickness and Interfacial Phenomena of Exfoliated Graphene on SiO$_{2}$ via AC-AFM

  ORAL

  March 5, 2015, 4:18 PM – March 5, 2015, 4:30 PM

  Authors

  • Katherine Jinkins

    • Univ of Wisconsin, Platteville

  • Jorge Camacho

    • Univ of Wisconsin, Platteville

  • Lee Farina

    • Univ of Wisconsin, Platteville

  • Yan Wu

    • Univ of Wisconsin, Platteville

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• Visualization of Photo-induced Doping patterns in Graphene/Boron Nitride Heterostructures via Scanning Tunneling Microscopy

  ORAL

  March 5, 2015, 4:30 PM – March 5, 2015, 4:42 PM

  Authors

  • Jairo Velasco Jr.

    • University of California at Berkeley
    • UC Berkeley

  • Long Ju

    • University of California at Berkeley

  • Dillon Wong

    • University of California at Berkeley

  • Juwon Lee

    • University of California at Berkeley

  • Salman Kahn

    • University of California at Berkeley

  • Hsin-Zon Tsai

    • University of California at Berkeley

  • Chad Germany

    • University of California at Berkeley

  • Takashi Taniguchi

    • NIMS

  • Kenji Watanabe

    • NIMS

  • Alex Zettl

    • University of California at Berkeley

  • Feng Wang

    • University of California at Berkeley

  • Mike Crommie

    • University of California at Berkeley

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• A Correlation of Raman and Single and Multiple Layer Graphene Conductivity As Detected With A Cryogenic Multiprobe AFM With On-line Raman, NSOM and Other SPM Modalities

  ORAL

  March 5, 2015, 4:42 PM – March 5, 2015, 4:54 PM

  Authors

  • Aaron Lewis

    • Hebrew University of Jerusalem, Benin School of Engineering \& Applied Science, Jerusalem, Israel

  • Oleg Zinoviev

    • Nanonics Imaging Ltd., Jerusalem, Israel

  • Oleg Zinoviev

    • Nanonics Imaging Ltd., Jerusalem, Israel

  • Oleg Zinoviev

    • Nanonics Imaging Ltd., Jerusalem, Israel

  • Oleg Zinoviev

    • Nanonics Imaging Ltd., Jerusalem, Israel

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• Electron Tunneling Spectroscopy of Single and Bilayer Graphene with Hexagonal Boron Nitride Tunneling Barrier

  ORAL

  March 5, 2015, 4:54 PM – March 5, 2015, 5:06 PM

  Authors

  • Suyong Jung

    • Korea Research Institute of Standards and Science

  • Jaesung Park

    • Korea Research Institute of Standards and Science

  • Chanyong Hwang

    • Korea Research Institute of Standards and Science

  • Donghan Ha

    • Korea Research Institute of Standards and Science

  • Kenji Watanabe

    • National Institute for Materials Science

  • Takashi Taniguchi

    • National Institute for Materials Science

  • Pilkyung Moon

    • New York University Shanghai

  • Young-Woo Son

    • Korea Institute for Advanced Study

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• Thermal mirror buckling transitions in a pristine freestanding graphene membrane investigated by scanning tunneling microscopy

  ORAL

  March 5, 2015, 5:06 PM – March 5, 2015, 5:18 PM

  Authors

  • Kevin Schoelz

    • University of Arkansas

  • Vincent Meunier

    • Rensselaer Polytechnic Institute

  • Pradeep Kumar

    • University of Arkansas

  • Mehdhi Neek-Amal

    • Universiteit Antwerpen

  • Paul Thibado

    • University of Arkansas

  • Francois Peeters

    • Universiteit Antwerpen

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