Dopants and Defects in Semiconductors: Novel experimental techniques
FOCUS · L7 ·
Presentations
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Tailoring of materials properties under extreme conditions
COFFEE_KLATCH · Invited
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Authors
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Thomas Schenkel
- Lawrence Berkeley Natl Lab
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Polarization spectroscopy of defect-based single photon sources in ZnO
ORAL
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Authors
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Nicholas Jungwirth
- Cornell University
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Hung-Shen Chang
- Cornell University
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Mingde Jiang
- Cornell University
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Gregory Fuchs
- Cornell University
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A first principle approach using Maximally Localized Wannier Functions for computing and understanding elasto-optic reponse
ORAL
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Authors
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Xin Liang
- Yale University
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S. Ismail-Beigi
- Yale University
- Department of Applied Physics, Physics, Mechanical Engineering and Center for Research on Interface Structures and Phenomena, Yale University
- Department of Applied Physics, Yale University
- Center for Research on Interface Structures and Phenomena (CRISP), Yale University
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Modification of a scanning electron microscope (SEM) for insitu, nanometer size contact, electrical measurements of III-nitride transistors
ORAL
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Authors
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Camelia Selcu
- Department of Physics, The Ohio State University
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Zhichao Yang
- Department of Electrical and Computer Engineering, The Ohio State University
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Sriram Krishnamoorthy
- Department of Electrical and Computer Engineering, The Ohio State University
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Siddharth Rajan
- Department of Electrical and Computer Engineering, The Ohio State University
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Second-Harmonic Generation scanning microscopy of strain fields around Through-Silicon-Vias
ORAL
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Authors
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Yujin Cho
- Univ of Texas, Austin
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Farbod Shafiei
- Univ of Texas, Austin
- The University of Texas at Austin
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Bernardo Mendoza
- Centro de Investigaciones en Optica, Leon, Mexico
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Tengfei Jiang
- Univ of Texas, Austin
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Paul Ho
- Univ of Texas, Austin
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Michael Downer
- Univ of Texas, Austin
- Department of Physics, The University of Texas at Austin
- University of Texas at Austin
- The University of Texas at Austin
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Probing the effect of dopants (donors) within InAs/InGaAs/InAlAs Asymmetric Heterostructure wafer by magneto-THz spectroscopy
ORAL
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Authors
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Mehdi Pakmehr
- University at Buffalo (SUNY), Shiraz University
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Christian Heyn
- University of Hamburg
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Wolfgang Hansen
- University of Hamburg
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Sub-surface single ion detection in diamond: A path for deterministic color center creation
ORAL
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Authors
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John Abraham
- Sandia National Laboratories
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Brandon Aguirre
- Sandia National Laboratories
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Jose Pacheco
- Sandia National Laboratories
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Ryan Camacho
- Sandia National Laboratories
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Edward Bielejec
- Sandia National Laboratories
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ABSTRACT WITHDRAWN
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Uniaxial stress studies of H centers in In$_{\mathrm{2}}$O$_{\mathrm{3}}$
ORAL
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Authors
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Philip Weiser
- Lehigh University
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Michael Stavola
- Lehigh University
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W. Beall Fowler
- Lehigh University
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Lynn A. Boatner
- Oak Ridge National Laboratory
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Diffusion of H in In2O3 single crystals
ORAL
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Authors
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Ying Qin
- Lehigh University
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Weikai Yin
- Lehigh University
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Mike Stavola
- Lehigh University
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Beall Fowler
- Lehigh University
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Lynn Boatner
- Oak Ridge National Laboratory
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\textbf{Profiling the local carrier concentration and dopant distribution across a semiconductor quantum dot}
ORAL
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Authors
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Jenna Walrath
- Univ of Michigan - Ann Arbor
- University of Michigan
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A.S. Chang
- Univ of Michigan - Ann Arbor
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Y.H. Lin
- Univ of Michigan - Ann Arbor
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S. Huang
- Univ of Michigan - Ann Arbor
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R.S. Goldman
- Univ of Michigan - Ann Arbor
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Characterisation of potential barriers in a donor quantum dot defined by hydrogen resist lithography.
ORAL
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Authors
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Andreas Fuhrer
- IBM Research - Zurich
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Nikola Pascher
- IBM Research - Zurich
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Nanoscale Imaging of Band Gap and Defects in Polycrystalline CdTe Photovoltaic Devices
ORAL
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Authors
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Nikolai Zhitenev
- CNST, NIST
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Yohan Yoon
- U. Maryland / CNST
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Jungseok Chae
- U. Maryland / CNST
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Aaron Katzenmeyer
- U. Maryland / CNST
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Heayoung Yoon
- U. Maryland / CNST
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Sangmin An
- U. Maryland / CNST
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Joshua Shumacher
- CNST, NIST
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Andrea Centrone
- CNST, NIST
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