Magnetic Oxide Interfaces

FOCUS · R43 ·

Presentations

  • ORAL

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    Authors

    • Matthias Althammer

      • Walther-Mei{\ss}ner-Institut, Bayerische Akademie der Wissenschaften, Walther-Meissner-Strasse 8, 85748 Garching, Germany

    • Rohan Mishra

      • Department of Mechanical Engineering and Materials Science, Washington University in St. Louis, St. Louis, MO 63130 USA

    • Albina J. Borisevich

      • Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge,TN 37831 USA

    • Amit Vikam Singh

      • MINT Center, University of Alabama, Tuscaloosa AL 35487 USA

    • Sahar Keshavarz

      • MINT Center, University of Alabama, Tuscaloosa AL 35487 USA

    • Mehmet Kenan Yurtisigi

      • MINT Center, University of Alabama, Tuscaloosa AL 35487 USA

    • Patrick LeClair

      • MINT Center, University of Alabama, Tuscaloosa AL 35487 USA

    • Arunava Gupta

      • MINT Center, University of Alabama, Tuscaloosa AL 35487 USA

    View abstract →

  • ORAL

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    Authors

    • Benjam\'{\i}n Mart\'{\i}nez

      • Insititut de Ci\`encia de Materials de Barcelona (ICMAB/CSIC), Campus UAB, Bellaterra, E-08193

    • Laura L\'opez-Mir

      • Insititut de Ci\`encia de Materials de Barcelona (ICMAB/CSIC), Campus UAB, Bellaterra, E-08193

    • Regina Galceran

      • Insititut de Ci\`encia de Materials de Barcelona (ICMAB/CSIC), Campus UAB, Bellaterra, E-08193

    • Lluis Balcells

      • Insititut de Ci\`encia de Materials de Barcelona (ICMAB/CSIC), Campus UAB, Bellaterra, E-08193

    • Alberto Pomar

      • Insititut de Ci\`encia de Materials de Barcelona (ICMAB/CSIC), Campus UAB, Bellaterra, E-08193

    • Zorica Konstantinovic

      • Insititut de Ci\`encia de Materials de Barcelona (ICMAB/CSIC), Campus UAB, Bellaterra, E-08193

    • Felip Sandiumenge

      • Insititut de Ci\`encia de Materials de Barcelona (ICMAB/CSIC), Campus UAB, Bellaterra, E-08193

    • Carlos Frontera

      • Insititut de Ci\`encia de Materials de Barcelona (ICMAB/CSIC), Campus UAB, Bellaterra, E-08193

    View abstract →

  • ORAL

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    Authors

    • Luis Martinez

      • The Department of Physics, The University of Texas at El Paso

    • Srinivasa Rao Singamaneni

      • The Department of Physics, The University of Texas at El Paso

    • John Prater

      • Department of Materials Science and Engineering, The North Carolina State University

    • Jagdish Narayan

      • Department of Materials Science and Engineering, The North Carolina State University

    View abstract →

  • ORAL

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    Authors

    • Sangjae Lee

      • Yale Univ

    • Ankit Disa

      • Yale Univ

    • Frederick Walker

      • Department of Applied Physics, Yale University
      • Yale Univ
      • Department of Applied Physics and CRISP, Yale University
      • Yale University

    • Charles Ahn

      • Department of Applied Physics, Yale University
      • Yale Univ
      • Department of Applied Physics and CRISP, Yale University
      • Yale University

    View abstract →

  • ORAL

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    Authors

    • Ryan Need

      • Materials Department, University of California Santa Barbara

    • Patrick Marshall

      • Materials Department, University of California Santa Barbara

    • Brandon Isaac

      • Materials Department, University of California Santa Barbara

    • Eugen Weschke

      • BESSY-II, Helmholtz Zentrum Berlin

    • Andreas Suter

      • Swiss Muon Source, Paul Scherrer Institute

    • Michael Graf

      • Physics Department, Boston College

    • Susanne Stemmer

      • Materials Department, University of California Santa Barbara

    • Stephen Wilson

      • Materials Department, University of California Santa Barbara

    View abstract →

  • ORAL

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    Authors

    • Xiaoran Liu

      • University of Arkansas, Fayetteville, Arkansas 72701, USA

    • B Kirby

      • National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA

    • B Pal

      • Indian Institute of Science, Bangalore 560012, India

    • Y Cao

      • University of Arkansas, Fayetteville, Arkansas 72701, USA

    • M Kareev

      • University of Arkansas, Fayetteville, Arkansas 72701, USA

    • D Sarma

      • Indian Institute of Science, Bangalore 560012, India

    • J Freeland

      • Argonne National Laboratory, Argonne, Illinois 60439, USA

    • P Shafer

      • Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA

    • E Arenholz

      • Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA

    • J Chakhalian

      • Rutgers University, Piscataway, New Jersey 08854, USA

    View abstract →

  • ORAL

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    Authors

    • S.G.E. te Velthuis

      • Argonne National Laboratory
      • MSD, Argonne National Laboratory

    • Q. Wang

      • MSD, Argonne National Laboratory

    • Y. Liu

      • MSD, Argonne National Laboratory and QCMD, Oak Ridge National Laboratory

    • H. Ambaye

      • QCMD, Oak Ridge National Laboratory

    • V. Lauter

      • QCMD, Oak Ridge National Laboratory

    • T.R. Charlton

      • QCMD, Oak Ridge National Laboratory

    • M.R. Fitzsimmons

      • QCMD, Oak Ridge National Laboratory

    • M. Cabero

      • Universidad Complutense

    • J. Santamaria

      • Universidad Complutense

    View abstract →

  • ORAL

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    Authors

    • MiJin Jin

      • None

    • Seon Young Moon

      • None

    • Jungmin Park

      • None

    • Vijayakumar Modepalli

      • None

    • Junhyeon Jo

      • None

    • Shin-Ik Kim

      • None

    • Hyun Cheol Koo

      • None

    • Byoung-Chul Min

      • None

    • Hyun-Woo Lee

      • Department of Physics, Pohang University of Science and Technolog, Korea

    • Seung-Hyub Baek

      • Center for Electronic Materials and Spintronics, Korea Institute of Science and Technology(KIST), Korea

    • Jung-Woo Yoo

      • School of Materials Science and Engineering, Ulsan National Institute of Science and Technology(UNIST), Korea
      • School of Materials Science and Engineering -Low dimensional Carbon Materials Center, Ulsan National Institute of Science and Technology

    View abstract →