Focus Session: Dopants and Defects in Semiconductors - Nitrides

FOCUS · B28 ·

Presentations

  • ORAL

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    Authors

    • John Lyons

      • Materials Department, University of California, Santa Barbara

    • Anderson Janotti

      • University of California, Santa Barbara
      • Materials Department, University of California, Santa Barbara
      • University of California Santa Barbara

    • C.G. Van de Walle

      • Materials Department, University of California, Santa Barbara
      • Materials Department, University of California Santa Barbara
      • University of California, Santa Barbara
      • Materials Department, University of California Santa Barbara, CA 93106-5050
      • Materials Department, University of California at Santa Barbara
      • Materials Department, University of California, Santa Barbara, California, CA

    View abstract →

  • ORAL

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    Authors

    • Mayra Cervantes

      • Purdue University

    • Colin Edmunds

      • Purdue University

    • Donghui Li

      • Purdue University

    • Liang Tang

      • Purdue University

    • Jiayi Shao

      • Purdue University

    • Geoff Gardner

      • Birck Nanotechnology Center and School of Materials Engineering, Purdue University
      • Purdue University

    • Michael Manfra

      • Department of Physics, Birck Nanotechnology Center and Schools of Materials and Electrical and Computer Engineering, Purdue University
      • Dept. of Physics, Birck Nano Center, and Schools of Materials Engineering and Electrical and Computer Engineering, Purdue University
      • Purdue University

    • Oana Malis

      • Purdue University

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  • ORAL

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    Authors

    • Keith H. Warnick

      • Dept. of Physics and Astronomy, Vanderbilt University

    • Yevgeniy Puzyrev

      • Dept. of Physics and Astronomy, Vanderbilt University

    • Tania Roy

      • Dept. of Electrical Engineering and Computer Science, Vanderbilt University

    • Daniel M. Fleetwood

      • Dept. of Electrical Engineering and Computer Science, Dept. of Physics and Astronomy, Vanderbilt University

    • Ronald D. Schrimpf

      • Dept. of Electrical Engineering and Computer Science, Vanderbilt University

    • Sokrates T. Pantelides

      • Dept. of Physics and Astronomy, Vanderbilt University; Materials Science and Technology Division, Oak Ridge National Laboratory

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  • ORAL

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    Authors

    • Qimin Yan

      • Materials Department, University of California at Santa Barbara

    • Anderson Janotti

      • University of California, Santa Barbara
      • Materials Department, University of California Santa Barbara
      • Materials Department, University of California, Santa Barbara
      • Materials Department, University of California at Santa Barbara

    • Matthias Scheffler

      • Fritz-Haber-Institut der MPG, D-14195 Berlin
      • Fritz-Haber-Institut der MPG
      • Fritz Haber Institute of the Max Planck Society
      • Fritz-Haber-Institut der Max-Planck-Gesellschaft

    • C.G. Van de Walle

      • Materials Department, University of California, Santa Barbara
      • Materials Department, University of California Santa Barbara
      • University of California, Santa Barbara
      • Materials Department, University of California Santa Barbara, CA 93106-5050
      • Materials Department, University of California at Santa Barbara
      • Materials Department, University of California, Santa Barbara, California, CA

    View abstract →

  • ORAL

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    Authors

    • R.L. Field III

      • Department of Physics, University of Michigan

    • G. Vardar

      • Department of Materials Science and Engineering, University of Michigan

    • Y. Jin

      • Department of Physics, University of Michigan

    • T. Dannecker

      • Tyndall National Institute, University College Cork

    • Y.Q. Wang

      • Materials Science and Technology Division, Los Alamos National Laboratory

    • C. Kurdak

      • Department of Physics, University of Michigan

    • R.S. Goldman

      • Department of Materials Science and Engineering, University of Michigan

    View abstract →