Plasma Etching I
ORAL · GT2 · ID: 3430234
Presentations
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Computational investigation on the effects of ion transport in HAR pattern MASK etching with Ar plasma
ORAL
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Presenters
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Byeong Yeop Choi
- Chungnam National University
Authors
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Byeong Yeop Choi
- Chungnam National University
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SiJun Kim
- Chungnam Natl Univ
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Wonnyoung Jeong
- Chungnam Natl Univ
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Youngseok Lee
- Chungnam Natl Univ
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Inho Seong
- Chungnam Natl Univ
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Chulhee Cho
- Chungnam Natl Univ
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Minsu Choi
- Chungnam Natl Univ
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ShinJae You
- Chungnam National University
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Control of Ion Energy and Angle Distribution via Waveform-Driven Embedded Electrode in Capacitively coupled plasma by using two-dimensional particle in cell simulation
ORAL
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Presenters
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Seoi Choi
- Pusan National University
Authors
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Seoi Choi
- Pusan National University
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HaeJune Lee
- Pusan National University
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Positive Pulse Voltage Superposition to an RF Electrode in a Dual-Frequency Capacitively Coupled Plasma for Relaxation of Positive Charging at Bottom of High Aspect Ratio Holes
ORAL
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Presenters
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Takuya Kikuchi
- Nagoya University
Authors
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Takuya Kikuchi
- Nagoya University
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Haruka Suzuki
- Nagoya University; cLPS, Nagoya University
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Makoto Moriyama
- Advanced Memory Development Center, Kioxia Corporation
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Kota Tamura
- Frontier Technology R&D Institute, Kioxia Corporation.
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Kuboi Shuichi
- Frontier Technology R&D Institute, Kioxia Corporation.
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Daiki Iino
- Frontier Technology R&D Institute, Kioxia Corporation.
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Hiroyuki Fukumizu
- Frontier Technology R&D Institute, Kioxia Corporation.
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Kazuaki Kurihara
- Frontier Technology R&D Institute, Kioxia Corporation.
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Hirotaka Toyoda
- Nagoya University; cLPS, Nagoya University
- Nagoya University
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Remediation of Charging During Pulsed Plasma Etching of High Aspect Ratio Features in Dielectric Materials: Applications to Cryogenic Etching
ORAL
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Presenters
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Mark J Kushner
- University of Michigan
Authors
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Chenyao Huang
- University of Michigan - Ann Arbor
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Yeon Geun Yook
- University of Michigan
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Yifan Gui
- University of Michigan
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Mark J Kushner
- University of Michigan
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Reliable wafer level plasma diagnostics under various rf bias power
ORAL
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Presenters
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DEOKHWAN KIM
- Hanyang university
- Department of electrical engineering, Hanyang University, Seoul, Korea
- Department of Electrical Engineering, Hanyang University
Authors
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DEOKHWAN KIM
- Hanyang university
- Department of electrical engineering, Hanyang University, Seoul, Korea
- Department of Electrical Engineering, Hanyang University
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Hyundong Eo
- SEMES
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Oh-Chang Lee
- Hanyang university
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Jae-Sung Park
- Hanyang university
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Chin-Wook Chung
- Department of electrical engineering, Hanyang University, Seoul, Korea1
- Hanyang University
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