Diffuse Scattering in Artificial Ferroelectric Superlattices Via Resonant X-ray Scattering

Artificial heterostructures are fascinating candidates for realizing intriguing properties due to bulk-terminated energy contributions and interfacial interactions by fine tuning various degrees of freedom. Ferroelectric materials are particularly sensitive to dimensionality, especially their domain structure. We utilized pulsed laser deposition grown thin films to allow unit-cell precision to investigate the evolution of these domain structures. These varied structures give unique signatures in their x-ray diffuse scattering profiles. Temperature-dependent resonant x-ray scattering was used to clarify the role of the constituent atoms and evidence the domain structure as a function of ferroelectric thickness. Such findings clarify the balance of competing interactions in dimensionally-controlled ferroelectrics and hint at pathways to realize artificial functional materials with potential device applications.