Design considerations for diffraction measurements in the TPa regime
POSTER
Abstract
Diffraction measurements from a variety of materials compressed above 1 TPa has been demonstrated on the OMEGA and NIF facilities. Thin samples of the material are sandwiched between diamond slabs and ramp-compressed using shaped laser pulses. X-ray diffraction is recorded by flashing an short (1 ns) x-ray source at the time of peak compression, and pressure is determined through concomitant VISAR measurements. A selection of considerations regarding the experimental design and data analysis are herein presented.