In-situ x-ray diffraction, electrical resistivity and thermal conductivity measurements using a Paris-Edinburgh cell

We have designed a special sample cell assembly for simultaneous and in-situ x-ray diffraction, electrical resistance, and thermal conductivity measurements with Paris-Edinburgh type large volume press. Initial measurements have been performed on bismuth (Bi) to up to 7 GPa and 1000$^{\circ}$C. Using Bi, which has a number of well-investigated solid-solid and solid-melt transitions, we have been able to demonstrate the feasibility of performing in-situ measurements and correlating the measured electrical-thermal-structural properties over a broad range of P-T conditions. The goal of developing this new multi-probe measurement capability is to further improve detection of the onset of solid-solid/melt transitions, relate structural and electrical properties of materials, determine changes in thermal conductivity at high P-T, and ultimately extend the technique for investigating other parameters, such as the Seebeck coefficient of thermoelectric materials.