High pressure x-ray diffraction and Raman spectra study of V$_{2}$O$_{3}$
POSTER
Abstract
The structural and vibrational properties of V$_{2}$O$_{3}$ have been investigated on basis of synchrotron X-ray diffraction and Raman scattering in a diamond anvil cell. The structure analysis based on the Rietveld refinement methods shows the pressure dependence of V-O and V-V bonding distances. The compressibility of volume and cell axis under different pressure medium is discussed. The pressure dependence of Raman modes was obtained and compared with the existing low temperature measurements. A new high pressure phase of V$_{2}$O$_{3}$ was observed by x-ray diffraction and also predicted by ab initio method. This new phase has similar structure with low temperature phase.