Single-Shot Ellipsometry for the Z-Machine

POSTER

Abstract

We have developed a single-shot ellipsometry diagnostic capable of taking time-resolved measurements. A comparison of dielectric constants obtained using this method with those from a standard spectroscopic ellipsometry technique showed good agreement when used to measure a static Au sample. The ellipsometer is being designed for use on the Z-machine at Sandia National Laboratories to measure the conductivity of Fe at pressures and temperatures of the Earth's core.

Authors

  • Sean Grant

    • University of Texas at Austin

  • Aaron Bernstein

    • University of Texas at Austin

  • Tom Ao

    • Sandia National Laboratories

  • Jean-Paul Davis

    • Sandia National Laboratories

  • Todd Ditmire

    • University of Texas at Austin

  • D.H. Dolan

    • Harvard University
    • Sandia National Laboratories
    • Sandia National Labs

  • Dawn Flicker

    • Sandia National Laboratories

  • Jung-Fu Lin

    • University of Texas at Austin

  • Nathan Riley

    • University of Texas at Austin

  • Chris Seagle

    • Sandia National Laboratories