Ionic-Liquid Gated Bilayer MoS$_{2}$ Field-Effect Transistors

POSTER

Abstract

We report the electrical characterization of ionic-liquid-gated bilayer MoS$_{2}$ field-effect transistors. An On-Off current ratio greater than 10$^{6}$ is achieved for hole transport, while that for electron transport exceeds 10$^{8}$. The subthreshold swing of our bilayer MoS$_{2}$ devices reaches as low as 47 mV/dec at 230 K, approaching the theoretical limit. We also demonstrate that 1) the extrinsic mobility of back-gated MoS$_{2}$ field-effect transistors is largely limited by the contact resistance; and 2) the extremely large electrical-double-layer capacitance of ionic liquid significantly reduces the Schottky contact barrier leading up to three orders of magnitude mobility increase for electron transport.

*This work was supported by NSF (No. ECCS-1128297). Part of this research was conducted at the Center for Nanophase Materials Sciences under project \# CNMS2011-066.

Authors

  • Meeghage Madusanka Perera

    • Wayne State University
  • Hsun-Jen Chuang

    • Wayne State University
  • Ming-Wei Lin

    • Wayne State University
  • Bhim Chamlagain

    • Wayne State University
  • Xuebin Tan

    • Wayne State University
  • Mark Ming-Cheng Cheng

    • Wayne State University
  • Zhixian Zhou

    • Wayne State University