Energy Spread Measurements of Cold Field Emitting HfC(310)

Cold field emitting HfC(310) has been researched as a potential next generation electron source for high resolution electron microscopy. Energy spread measurements were taken using a retarding potential energy analyzer. Measurements were taken over a range of angular intensities, varying from 5 uA/Sr to 100 uA/Sr, and compared to theoretical values determined numerically using a software program. Experimental data was compared with cold field W(100), a commercially available cold field emission source currently used in high resolution electron microscopy.