Direct evidence for the suppression of charge stripes in epitaxial La$_{5/3}$Sr$_{1/3}$NiO$_4$ thin films

POSTER

Abstract

We have successfully grown epitaxial La$_{5/3}$Sr$_{1/3}$NiO$_4$ films with a small crystalline mosaic using pulsed laser deposition. With synchrotron radiation, the x-ray diffraction peaks associated with charge stripes have been successfully observed for relatively thick films. Anomalies due to the charge-ordering transition have been examined using four-point probe resistivity measurement. We also have produced multilayer films with the same total thickness through the use of thin films La$_{5/3}$Sr$_{1/3}$NiO$_4$ alternating with SrTiO$_3$. A thorough search for the charge stripe peaks in the multilayers has been negative; the stripes appear to be suppressed for epitaxial thin films. This suggests that electron-lattice interactions are critical for the formation of stripe phases.

*This work is supported through NSF DMR-0239667. X-ray diffraction data were taken at NSLS, Brookhaven National Laboratory.

Authors

  • Changkun Xie

    • Department of Physics, University of Connecticut, Storrs, CT 06269
  • Joseph Budnick

    • Department of Physics, University of Connecticut, Storrs, CT 06269
  • Barrett Wells

    • Department of Physics, University of Connecticut, Storrs, CT 06269
  • Feizhou He

    • Canadian Light Source, University of Saskatchewan, Saskatoon, Canada
  • Arnold Moodenbaugh

    • Materials Science Department, Brookhaven National Lab, Upton, NY 11973