Atomic Force Microscope-induced Surface Modifications in CaMnO3 Thin Films
POSTER
Abstract
Our recent work on epitaxial thin films of this material has shown that films with a tensile lattice mismatch strain exhibit structural and electrical properties that indicate oxygen deficiency. We observe thickness dependent changes in surface morphology that are consistent with strain-induced oxygen vacancies. Morphology of strained films shows a time dependence suggesting progressive oxygenation, as revealed by Atomic Force Microscopy (AFM). We have also studied surface modifications in these films introduced by a voltage biased AFM tip. We will discuss then characteristics of such surface modifications as compared to our previous results in thin films of hole-doped manganites.
*We acknowledge support from the Towson Office of University Undergraduate Research, Fisher Endowment Grant and Undergraduate Research Grant from the Fisher College of Science and Mathematics, and Seed Funding grant from the School of Emerging technologies