Depth dependent atomic valence determination by synchrotron techniques

ORAL

Abstract

We investigate the layer-dependent atomic valence in magnetoelectric La0.7Sr0.3MnO3/PbZr0.2Ti0.8O3 heterostructures. X-ray absorption spectroscopy measurements were taken in both bulk-sensitive fluorescence yield and surface-sensitive total electron yield mode to determine the Mn valence. These measurements were taken at the Advanced Light Source at Lawrence Berkeley National Labs. The experimentally measured valence is modeled and compared with theory to determine the layer-by-layer atomic valence.

*This work was supported by the WV Higher Education Policy Commission Research Challenge Grant No. HECP.dsr.12.29

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Authors

  • Robbyn Trappen

    • West Virginia University
    • West Virginia University, USA

  • Mikel Holcomb

    • West Virginia University

  • Jinling Zhou

    • West Virginia University

  • Ying-Hao Chu

    • National Chiao Tung University

  • Vu Tra

    • National Chiao Tung University