Scanning multiprobe microscopy for mesoscopic devices and materials: Part II

ORAL

Abstract

The ability to simultaneously characterize a quantum material or device with several modalities is invaluable for advancing condensed matter physics. We have developed a multimodal scanning probe microscope capable of bringing a generic ensemble of silicon nanofabrication compatible sensors close to mesoscopic devices in cryogenic environments. In part two of this talk, I will present efforts on integrating our multiprobe platform into a cryogen-free dilution refrigerator scanning system. I discuss preliminary results benchmarking the system's performance for atomic force microscopy (AFM), scanning single electron transistor (SET) microscopy, and electrical transport from DC to 10 GHz.

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Presenters

  • Patrick R Forrester

    • Harvard University

Authors

  • Patrick R Forrester

    • Harvard University

  • EliseAnne C Koskelo

    • Harvard University

  • Yuan Cao

    • Harvard University

  • Pengjie Wang

    • Princeton University

  • Myungchul Oh

    • Princeton University
    • Pohang University of Science and Technology

  • Zhuozhen Cai

    • Harvard University

  • Yonglong Xie

    • Harvard University

  • Jiachen Yu

    • Princeton University

  • Martin V Gustafsson

    • Raytheon BBN Technologies
    • BBN Technology - Massachusetts

  • Ali Yazdani

    • Princeton University

  • Amir Yacoby

    • Harvard University