Superfluid stiffness of twisted multilayer graphene: Part-1

ORAL

Abstract

Superfluid stiffness measurements offer a powerful probe of the superconducting state and a primary means to characterize their pairing symmetries. While penetration depth experiments can be used in bulk materials to extract superfluid stiffness, for two-dimensional materials with a small sample volume, alternative methods are required. Here we discuss the development of a technique to measure the superconducting kinetic inductance in low-dimensional materials and apply it to twisted multilayer graphene. We investigate superfluid stiffness as a function of carrier density and temperature and provide interpretations for possible pairing symmetries.

Presenters

  • Abhishek Banerjee

    • Harvard University

Authors

  • Abhishek Banerjee

    • Harvard University
  • Zeyu Hao

    • Harvard University
  • Mary Kreidel

    • Harvard University
  • Isabelle Y Phinney

    • Harvard University
  • Jeong Min Park

    • Massachusetts Institute of Technology
  • Patrick Ledwith

    • Harvard University
    • Harvard university
  • Andrew Zimmerman

    • Harvard University
  • Robert M Westervelt

    • Harvard University
  • Pablo Jarillo-Herrero

    • Massachusetts Institute of Technology MI
    • Massachusetts Institute of Technology MIT
    • Massachusetts Institute of Technology
  • Pavel A Volkov

    • University of Connecticut
  • Ashvin Vishwanath

    • Harvard University
  • Kin Chung Fong

    • Raytheon BBN Technologies
    • Raytheon BBN
    • BBN Raytheon
  • Philip Kim

    • Harvard University