Breaking the limitation of polarization multiplexing in optical metasurfaces with engineered noise

ORAL

Abstract

Noise is usually undesired yet inevitable in science and engineering. However, by introducing the engineered noise to the precise solution of Jones matrix elements, we break the fundamental limit of polarization multiplexing capacity of metasurfaces that roots from the dimension constraints of the Jones matrix. We experimentally demonstrate up to 11 independent holographic images using a single metasurface illuminated by visible light with different polarizations. To the best of our knowledge, it is the highest capacity reported for polarization multiplexing. Combining the position multiplexing scheme, the metasurface can generate 36 distinct images, forming a holographic keyboard pattern. This discovery implies a new paradigm for high-capacity optical display, information encryption, and data storage.

Reference:

Bo Xiong, Yu Liu, Yihao Xu, Lin Deng, Chao-Wei Chen, Jia-Nan Wang, Ruwen Peng, Yun Lai, Yongmin Liu, Mu Wang, “Breaking the limitation of polarization multiplexing in optical metasurfaces with engineered noise", Science 379, 294-299 (2023).

*This work is supported by the NSF and MOST of China, and also by the NSF, USA.

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Publication: Bo Xiong, Yu Liu, Yihao Xu, Lin Deng, Chao-Wei Chen, Jia-Nan Wang, Ruwen Peng, Yun Lai, Yongmin Liu, Mu Wang, "Breaking the limitation of polarization multiplexing in optical metasurfaces with engineered noise", Science 379, 294-299 (2023).

Presenters

  • Ruwen Peng

    • National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, China
    • Nanjing Univ

Authors

  • Ruwen Peng

    • National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, China
    • Nanjing Univ

  • Bo Xiong

    • National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, China

  • Yu Liu

    • National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, China

  • Yihao Xu

    • Department of Mechanical and Industrial Engineering, Northeastern University, Boston, Massachusetts 02115, USA

  • Lin Deng

    • Department of Electrical and Computer Engineering, Northeastern University, Boston, Massachusetts 02115, USA

  • Yongmin Liu

    • Department of Mechanical and Industrial Engineering, Northeastern University, Boston, Massachusetts 02115, USA

  • Mu Wang

    • National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093,China