Dark field x-ray microscopy for mesoscale phenomena in ordered quantum, structural, and functional materials at modern light sources

ORAL

Abstract

Single-crystal diffraction reveals an ‘average’ view of ordered materials; in contrast, dark field x-ray microscopy (DFXM) provides real-space images of mesoscale inhomogeneities that encode spatial information on a Bragg, or a super-lattice (e.g. charge-density wave, magnetic order) peak. In DFXM, a lens magnifies a Bragg peak exiting a sample to form an image. DFXM carried out concurrently with in situ multi-modal measurements can shed light on underlying correlations of materials properties to mesoscale features. Some examples are presented to illustrate the potency of DFXM and introduce cryogenic and associated instrumentation.

*This research used resources of the APS, a US DOE Scientific User Facility, operated for the DOE Office of Science by Argonne National Laboratory under Contract DE-AC02-06CH11357.

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Publication: Zhi Qiao, Xianbo Shi, Peter Kenesei, Arndt Last, Lahsen Assoufid, and Zahir Islam, "A large field-of-view high-resolution hard x-ray microscope using polymer optics," Rev. Sci. Instrum. 91, 113703 (2020); https://doi.org/10.1063/5.0011961; Ishwor Poudyal, Zhi Qiao, Michael R. Armstrong, and Zahir Islam, "Pump-probe dark-field x-ray microscopy", arXiv:2210.06243v1, cond-mat.mtrl-sci, (2022).

Presenters

  • Zahir Islam

    • Argonne National Laboratory

Authors

  • Zahir Islam

    • Argonne National Laboratory

  • Elliot S Kisiel

    • University of California, San Diego

  • Jayden C Plumb

    • UC Santa Barbara; Argonne National Laboratory

  • Omar Shohoud

    • Argonne National Laboratory

  • Ishwor Poudyal

    • Materials Science Division, Argonne National Laboratory

  • Zhan Zhang

    • Argonne National Laboratory
    • argonne national laboratory

  • Siddarth Maddali

    • Argonne National Laboratory

  • Stephan O Hruszkewycz

    • Argonne National Laboratory