Surface Segregation in Fe-Ge Thin Films

POSTER

Abstract

Angle-resolved X-ray photoemission spectroscopy (XPS) has been used to study the surface composition of Fe-Ge thin films. The surfaces of Fe-Ge thin films have not been studied extensively but conclusion here is that under some circumstances, Fe-Ge thin films favor iron segregation to the surface in spite of the larger moment of Fe. A model has been developed to assist in the analysis of the experimental angle-resolved XPS data to construct a more quantitative picture of the surface composition and surface enthalpies. The XPS spectra are indicative of interactions between Ge and Fe arguing against an alloy with strong clustering. Si capping layers have pin-holes that can lead to limited oxidation.

*This research was supported by the National Science Foundation through the Tuskegee University, National Science Foundation, Partnership for Research and Education in Materials NSF-DMR: 1827690 and through EPSCoR RII Track-1: Emergent Quantum Materials and Technologies (EQUATE), Award OIA-2044049.

Publication: None at the moment. Research is still ongoing.

Presenters

  • Jack L Rodenburg

    • University of Nebraska - Lincoln
    • University of Nebraska-Lincoln
    • University of Nebraska- Lincoln

Authors

  • Jack L Rodenburg

    • University of Nebraska - Lincoln
    • University of Nebraska-Lincoln
    • University of Nebraska- Lincoln

  • Gauthami Viswan

    • University of Nebraska - Lincoln

  • Mohammad Z Zaz

    • University of Nebraska - Lincoln
    • University of Nebraska- Lincoln

  • Esha Mishra

    • University of Nebraska - Lincoln

  • Thilini K Ekanayaka

    • University of Nebraska - Lincoln

  • WaiKiat Chin

    • University of Nebraska - Lincoln

  • Peter A Dowben

    • University of Nebraska - Lincoln

  • Robert Streubel

    • University of Nebraska - Lincoln