Towards Design and Fabrication of Transmons using Single-Crystal Silicon Fins
ORAL
Abstract
While the invention of the transmon has fueled rapid developments in the quantum information systems field, decoherence sources inherent in the materials and scaling challenges remain limitations as the field moves to larger scale quantum processing units. Improvements in materials growth and device processing have driven improvements to transmon coherence, though little has changed in ways of the transmon designs which typically consist of a planar superconducting capacitor shunted by an aluminum/aluminum-oxide/aluminum Josephson junction. In this work, we incorporate high aspect ratio fins fabricated from low-loss, single-crystal silicon in superconducting circuits to enhance transmon coherence and scalability. Loss measurements performed on lumped element resonators fabricated using parallel plate capacitors made from silicon fins show significant improvement over conventional interdigitated capacitor designs. Efforts to incorporate aluminum-contacted silicon fins as capacitors in transmon designs will be discussed as well as efforts to thin the silicon fins to the tunneling limit to realize merged element transmons using silicon fins.
*We acknowledge the support of the National Institute of Standards and Technology (NIST) Quantum Initiative and the U.S. National Science Foundation (Grant No. 1839136) for the microwave measurements; the New and Emerging Qubit Science and Technology (NEQST) Program initiated by the U.S. Army Research Office (ARO) under Grant No. W911NF2210052 for the device fabrication; and University of California, Santa Barbara (UCSB) National Science Foundation (NSF) Quantum Foundry through Q-AMASE-i Program via Award No. DMR-1906325 for the initial process developments, the epitaxial growth, and microscopy studies. We also acknowledge the use of shared facilities of the UCSB Materials Research Science and Engineering Centers (No. NSF DMR 1720256) and the Nanotech UCSB Nanofabrication Facility.
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Presenters
Anthony Q McFadden
University of California, Santa Barbara
NIST
National Institute of Standards and Tech
National Institute of Standards and Technology
Authors
Anthony Q McFadden
University of California, Santa Barbara
NIST
National Institute of Standards and Tech
National Institute of Standards and Technology
Aranya Goswami
University of California, Santa Barbara
Tongyu Zhao
National Institute of Standards and Technology
National Institute of Standards and Technology Boulder
University of Colorado Boulder
University of Colorado, Boulder
Teun van Schijndel
University of California, Santa Barbara
Corey Rae H McRae
University of Colorado Boulder
University of Colorado, Boulder
Raymond W Simmonds
National Institute of Standards and Technology, Boulder
National Institute of Standards and Technology Boulder
David Pappas
National Institute of Standards and Technology Boulder