Repeated stabilizer measurements in a superconducting distance-3 surface code

ORAL

Abstract

We show the calibration and benchmarking of the weight-2 and weight-4 stabilizer measurements of the distance-3 surface code with a 17-transmon processor. We compare measured performance to a density matrix simulation considering various error models with input parameters extracted from experiment. We then initialize a logical state and assess the defect rates for multiple rounds of X- and Z-type stabilizer measurements. We also compare the defect error rates when running stabilizer measurements individually and simultaneously to evidence the impact of crosstalk and leakage errors.

*Research funded by IARPA (U.S. Army Research Office Grant No. W911NF-16-1-0071), Intel Corporation, the Dutch Ministry of Economic Affairs (TKI Allowance for Top Consortia for Knowledge and Innovation), and QuTech NWO (Project No. 601.QT.001-1).

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Presenters

  • Hany Ali

    • Delft University of Technology

Authors

  • Hany Ali

    • Delft University of Technology

  • Jorge F Marques

    • Qutech and Netherlands Organization for Applied Scientific Research
    • Delft University of Technology

  • Boris Varbanov

    • Delft University of Technology

  • Matvey Finkel

    • Qutech and Kavli Institute of Nanoscience, Delft University of Technology
    • QuTech and Kavli Institute of Nanoscience

  • Christos Zachariadis

    • QuTech and Kavli Institute of Nanoscience, Delft University of Technology, The Netherlands

  • Wouter J Vlothuizen

    • QuTech and Netherlands Organisation for Applied Scientific Research, The Netherlands

  • Marc Beekman

    • QuTech and Netherlands Organisation for Applied Scientific Research, The Netherlands

  • Nadia Haider

    • QuTech and Netherlands Organisation for Applied Scientific Research, The Netherlands

  • Barbara M Terhal

    • Delft University of Technology

  • Leonardo DiCarlo

    • Qutech and Kavli Institute of Nanoscience, Delft University of Technology
    • Delft University of Technology