Direct Detection for Dark Field X-ray Microscopy

ORAL

Abstract

The recent development of a US based dark field x-ray microscopy technique has opened up investigation into mesoscopic interactions in a myriad of materials. Even with high efficiency optics, some diffracted signals are often too weak to detect using the current scintillation based methods of imaging. We present here an amorphous-Se detector with small pixel size and high efficiency detection in the hard x-ray energy regime of 15 keV and beyond. Resolution, exposure times and feature detection capabilities are reported and compared against current optical detection methods.

*This material is based upon work supported by the U.S. Department of Energy, Office of Science, Office of Workforce Development for Teachers and Scientists, Office of Science Graduate Student Research (SCGSR) program. The SCGSR program is administered by the Oak Ridge Institute for Science and Education for the DOE under contract number DE-SC0014664. This research used resources of the Advanced Photon Source, a U.S. Department of Energy (DOE) Office of Science user facility operated for the DOE Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357. This work was supported as part of the "Quantum Materials for Energy Efficient Neuromorphic Computing" (Q-MEEN-C), an Energy Frontier Research Center funded by the U.S. Department of Energy, Office of Science, Basic Energy Sciences under the Award No. DESC0019273.

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Publication: Direct Detection for use in Low-Intensity X-ray Microscopy

Presenters

  • Elliot S Kisiel

    • University of California, San Diego

Authors

  • Elliot S Kisiel

    • University of California, San Diego

  • Alex Frano

    • UC San Diego
    • University of California, San Diego

  • Zahir Islam

    • Argonne National Laboratory

  • Ishwor Poudyal

    • Materials Science Division, Argonne National Laboratory

  • Antonino Miceli

    • Argonne National Laboratory

  • Peter Kenesei

    • Argonne National Laboratory