Measurements of superconducting qubits containing through-silicon vias
ORAL
Abstract
Superconducting qubits have developed from proof-of principle single-bit demonstrations to mature deployments of many-qubit quantum processors. With increased processor size comes the need for vertical input/output capabilities, which previously motivated the development of high-density superconducting thru-silicon vias (TSVs) for connecting grounds and route signals from opposite sides of substrate chips1. The potential utility of a TSV goes far beyond signal routing, in particular, a high-aspect-ratio TSV has a large capacitance that makes it a powerful tool for miniaturizing the largest-footprint components of superconducting quantum processors including the readout resonators and even qubits themselves. In this work we demonstrate compact TSV-enabled lumped-element resonators that provides vertical readout integration at a pitch smaller than that of a standard transmon qubit. We additionally demonstrate high-coherence transmon qubits for which TSVs provide the shunting capacitance, shrinking the on-chip footprint of the qubit by a factor of 10. We provide a bound on the loss in the TSV capacitor and discuss its possible future use in different superconducting qubits.
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*This material is based upon work supported by the U.S. Department of Energy, Office of Science, Office of Advanced Scientific Computing Research, High Performance Computing and Network Facilities (Rep - Quantum Testbeds), under contract number: FWP #FP00008338, and by the Under Secretary of Defense for Research and Engineering under Air Force Contract No. FA8702-15-D-0001. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the Department of Energy or the Under Secretary of Defense for Research and Engineering.
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Presenters
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Thomas M Hazard
- MIT Lincoln Lab
- MIT Lincoln Laboratory