Novel Semiconductors Thin Film Growth and Characterization

ORAL · N32 · ID: 1108589






Presentations

  • ORAL

    Presenters

    • Yipu XIA

      • The University of Hong Kong

    Authors

    • Yipu XIA

      • The University of Hong Kong
    • Degong Ding

      • Zhejiang University
    • Ke Xiao

      • The University of Hong Kong
    • Junqiu Zhang

      • the University of Hong Kong
      • The University of Hong Kong
    • Shaogang Xu

      • Southern University of Science and Technology
    • Daliang He

      • Zhejiang University
    • Xingyu Yue

      • The University of Hong Kong
      • the University of Hong Kong
      • Department of Physics, the University of Hong Kong, Pokfulam Road, Hong Kong, People's Republic of China
    • Xiong Wang

      • The University of Hong Kong
    • Sujuan Ding

      • Zhejiang University
    • Mengfei Yuan

      • The University of Hong Kong
    • Wingkin Ho

      • the University of Hong Kong
      • The University of Hong Kong
    • Hu Xu

      • SUSTC
      • Southern University of Science and Technology
    • Xiaodong Cui

      • The University of Hong Kong
    • Chuanhong Jin

      • Zhejiang University
    • Maohai Xie

      • the University of Hong Kong
      • The University of Hong Kong

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  • ORAL

    Presenters

    • Marcus A Rose

      • Towson University

    Authors

    • Marcus A Rose

      • Towson University
    • Prabesh Bajracharya

      • Morgan State
      • Morgan State University
    • Serene Kamal

      • Johns Hopkins University
    • Arlene Chiu

      • Johns Hopkins University
    • Jesse Liebman

      • Johns Hopkins University
    • Rajeswari M Kolagani

      • Towson University
    • Natalia Drichko

      • Johns Hopkins University
    • Susanna M Thon

      • Johns Hopkins University
    • Ramesh C Budhani

      • Morgan State University

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  • ORAL

    Publication: 1. Zheng, Zhaoqiang, et al. "Flexible, transparent and ultra-broadband photodetector based on large-area WSe2 film for wearable devices." Nanotechnology 27.22 (2016): 225501.
    2. Xu, Xiangming, et al. "Growth of 2D Materials at the Wafer Scale." Advanced Materials 34.14 (2022): 2108258.

    Presenters

    • Rohit R Srivastava

      • Morgan State University

    Authors

    • Rohit R Srivastava

      • Morgan State University
    • Rajeev Nepal

      • Morgan State University
    • Pranish Shrestha

      • Morgan State University
    • Ravinder Kumar

      • Morgan State University
    • vinay Sharma

      • Morgan State University
    • Alexander Samokhvalov

      • Morgan State University
    • Birol Ozturk

      • Morgan State University
      • Morgan State University, Department of Physics
    • Ramesh C Budhani

      • Morgan State University

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  • ORAL

    Presenters

    • Junqiu Zhang

      • the University of Hong Kong
      • The University of Hong Kong

    Authors

    • Junqiu Zhang

      • the University of Hong Kong
      • The University of Hong Kong
    • Yipu XIA

      • The University of Hong Kong
    • Zhoubin Yu

      • Zhejiang University
    • Mengfei Yuan

      • the University of Hong Kong
    • Xingyu Yue

      • The University of Hong Kong
      • the University of Hong Kong
      • Department of Physics, the University of Hong Kong, Pokfulam Road, Hong Kong, People's Republic of China
    • Yuanjun Jin

      • the University of Hong Kong
    • Yue Feng

      • SUSTC
    • Bin Li

      • SUSTC
    • Bo Wang

      • Zhejiang University
    • Wingkin Ho

      • the University of Hong Kong
      • The University of Hong Kong
    • Chang Liu

      • SUSTC
    • Hu Xu

      • SUSTC
      • Southern University of Science and Technology
    • Chuanhong Jin

      • Zhejiang University
    • Maohai Xie

      • the University of Hong Kong
      • The University of Hong Kong

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  • ORAL

    Publication: E Soares, J Paier, L Gura, K Burson, C Ryczek, Z Yang, F Stavale, M Heyde, H-J Freund, "Structure and registry of the silica bilayer film on Ru(0001) as viewed by LEED and DFT," in submission

    Presenters

    • Kristen Burson

      • Grinnell College

    Authors

    • Kristen Burson

      • Grinnell College
    • Edmar A Soares

      • Department of Physics, Federal University of Minas Gerais, Brazil
    • Joachim Paier

      • Institute for Chemistry, Humboldt University, Berlin
    • Leonard Gura

      • Fritz-Haber Institute, Berlin, Germany
    • Catherine N Ryczek

      • Hamilton College
    • Zechao Yang

      • Fritz-Haber Institute, Berlin, Germany
    • Fernando Stavale

      • Centro Brasileiro de Pesquisas Físicas, Rio de Janeiro, Brazil
    • Markus Heyde

      • Fritz-Haber Institute, Berlin, Germany
    • H J Freund

      • Fritz-Haber Institute

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  • ORAL

    Publication: 1. Electron Beam as Straightener to De-Wrinkle Large 2D Black Phosphorus Flake: An In Situ TEM Monitoring (https://doi.org/10.1002/admi.202201320)

    Presenters

    • MANPREET KAUR

      • Institute of Nano Science and Technology (INST)

    Authors

    • MANPREET KAUR

      • Institute of Nano Science and Technology (INST)

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  • ORAL

    Presenters

    • Furkan M Altincicek

      • University of Alberta

    Authors

    • Furkan M Altincicek

      • University of Alberta
    • Christopher Leon

      • University of Alberta
    • Taras Chutora

      • University of Alberta
    • Max Yuan

      • University of Alberta
    • Jeremiah Croshaw

      • Univ of Alberta
      • University of Alberta
    • Roshan Achal

      • Univ of Alberta
      • University of Alberta
    • Lucian Livadaru

      • Quantum Silicon
      • Quantum Silicon Inc.
    • Jason Pitters

      • Quantum Silicon
      • National Research Council Canada
    • Robert A Wolkow

      • Univ of Alberta
      • University of Alberta

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  • ORAL

    Presenters

    • Du Li

      • Washington University in St. Louis

    Authors

    • Du Li

      • Washington University in St. Louis
    • Kun Wang

      • University of Nebraska - Lincoln
      • Department of Physics and Astronomy & Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln
      • Department of Physics and Astronomy & Nebraska Center for Materials and NanoscienceUniversity of Nebraska - Lincoln
      • Physics and Astronomy, University of Nebraska-Lincoln
    • Jia Wang

      • Department of Physics and Astronomy & Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln
      • University of Nebraska-Lincoln
      • Department of Physics and Astronomy & Nebraska Center for Materials and NanoscienceUniversity of Nebraska-Lincoln
      • Physics and Astronomy, University of Nebraska-Lincoln
    • Yifei Hao

      • University of Nebraska - Lincoln
      • Department of Physics and Astronomy & Nebraska Center for Materials and Nanoscience,University of Nebraska - Lincoln
      • Physics and Astronomy, University of Nebraska-Lincoln
    • Hailey Anderson

      • University of Nebraska-Lincoln
    • Xia Hong

      • Physics and Astronomy, University of Nebraska-Lincoln
      • Department of Physics and Astronomy & Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln
    • Li Yang

      • Washington University, St. Louis

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  • ORAL

    Publication: Dahule, Rohit, Chetan C. Singh, Kenta Hongo, Ryo Maezono, and Emila Panda. "Anomalies in the bulk and surface electronic properties of SnS: effects of native defects." Journal of Materials Chemistry C 10, no. 14 (2022): 5514-5525.

    Presenters

    • Rohit Dahule

      • Japan Adv Inst of Sci and Tech

    Authors

    • Rohit Dahule

      • Japan Adv Inst of Sci and Tech
    • Chetan C Singh

      • Indian Institute of Technology, Gandhinagar
    • Emila Panda

      • Indian Institute of Technology, Gandhinagar
    • Kenta Hongo

      • Japan Adv Inst of Sci and Tech
      • JAIST
    • Ryo Maezono

      • Japan Adv Inst of Sci and Tech
      • JAIST

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