Size scale-dependent failure of poly(methyl methacrylate) due to projectile impacts

ORAL

Abstract

Polymer glasses, such as poly(methyl methacrylate) (PMMA), are often used in impact mitigation applications where impact-resistance, optical transparency and light-weighting are required. However, our understanding regarding the failure behavior of these materials subjected to high-velocity projectile impact from the nanoscale up to macroscale is limited. In this contribution, we study the projectile impact performance of PMMA using two different projectile impact tests. For nanoscale studies, laser-induced projectile impact testing (LIPIT) was employed to investigate the impact performance of thin PMMA films, on the order of a few hundred nanometers in thickness, at strain rates of ~105 to 107 1/s. For macroscale studies, PMMA sheets with thicknesses on the order to 10 mm were subjected to ballistic and hypervelocity impacts in the strain-rate regime of ~106 1/s. By relating the minimum perforation velocity, defined as the minimum impact velocity a material can withstand without catastrophic failure, to specimen geometry and projectile size at these two distinct sizes, we demonstrate how the size-scale of the materials system defines the mechanisms of failure and its impact resistance.

*This research was conducted by Mississippi State University under contract to the U.S. Department of Defense (DoD) Military Engineering, through the US Army Engineering Research and Develop Center (ERDC) Contract #W912HZ21C0022. The views and conclusions contained herein are those of the authors and should not be interpreted as necessarily representing the official policies or endorsements, either expressed or implied, of the U.S. Army ERDC or the U.S. DoD.

Publication: N/A

Presenters

  • Kyle Callahan

    • Mississippi State University

Authors

  • Kyle Callahan

    • Mississippi State University
  • Santanu Kundu

    • Mississippi State University
  • Katherine M Evans

    • National Institute of Standards and Tech
  • Edwin P Chan

    • National Institute of Standards and Tech
  • William Heard

    • Engineer Research and Development Center