Probing Structural Disorder via Photothermal Deflection Spectroscopy

Photothermal Deflection Spectroscopy (PDS) is a technique that excels at measuring weak optical absorptions in thin-film samples. Such absorptions are typically the result of structural disorder, so PDS can be a powerful tool to probe the relative amount of disorder in materials. In this poster, we present PDS data aimed at measuring the relative level of defect states in photovoltaic materials such as perovskites and hole transport layers, and correlating those data with device performance and complementary forms of spectroscopy.