Spatially Resolved Potential and Li-Ion Distributions Reveal Performance-Limiting Regions in Solid-State Batteries
ORAL
Abstract
The performance of solid-state electrochemical systems is intimately tied to the potential and lithium distributions across electrolyte-electrode junctions that give rise to interface impedance. Here, we combine two operando methods, Kelvin probe force microscopy (KPFM) and neutron depth profiling (NDP), to identify the rate-limiting interface in operating Si-LiPON-LiCoO2 solid-state batteries by mapping the contact potential difference (CPD) and the corresponding Li distributions. The contributions from ions, electrons, and interfaces are deconvolved by correlating the CPD profiles with Li-concentration profiles and by comparisons with first-principles-informed modeling. We find that the largest potential drop and variation in the Li concentration occur at the anode-electrolyte interface, with a smaller drop at the cathode-electrolyte interface and a shallow gradient within the bulk electrolyte. Correlating these results with electrochemical impedance spectroscopy following battery cycling at low and high rates confirms a long-standing conjecture linking large potential drops with a rate-limiting interfacial process.
*M.W.S. acknowledges support from the Naval Research Laboratory Postdoctoral Fellowship through the American Society for Engineering Education.
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Publication:E. J. Fuller*, E. Strelcov*, J. L. Weaver*, M. W. Swift*, J. D. Sugar, T. Kurita, A. Kolmakov, N. Zhitenev, J. J. McClelland, Y. Qi, J. Dura, and A. A. Talin, "Spatially resolved potential and Li-ion distributions reveal performance-limiting regions in solid-state batteries", ACS Energy Lett. 6, 3944 (2021). DOI:10.1021/acsenergylett.1c01960
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M. W. Swift, H. Jagad, J. Park, Y. Qie, Y. Wu, and Y. Qi, "Predicting low-impedance interfaces for solid-state batteries" (submitted)
Presenters
Michael W Swift
US Naval Research Laboratory
Authors
Michael W Swift
US Naval Research Laboratory
Elliot J Fuller
Sandia National Laboratories
Evgheni Strelcov
National Institute of Standards and Technology
Jamie L Weaver
National Institute of Standards and Technology
Material Measurement Laboratory, National Institute of Standards and Technology
Joshua D Sugar
Sandia National Laboratories
Andrei Kolmakov
National Institute of Standards and Technology
Nikolai Zhitenev
National Institute of Standards and Technology
Jabez J McClelland
National Institute of Standards and Technology
Nanoscale Device Characterization Division, National Institute of Standards and Technology, Gaithersburg, MD USA