Characterizing noise-induced lifetime of a phase state in a Kerr nonlinear resonator
ORAL
Abstract
We compare the suitability of several mathematical methods to characterize the lifetime of two-level systems. The methods deal in different ways with random-walk fluctuations during a switch. Such fluctuations are not captured by a simple telegraph-noise picture and can lead to a significant overestimation of the switching rate. We show that this problem can be avoided by choosing the correct counting method. In addition to known methods relying on thresholds and the power spectral density of fluctuations, we establish that a peak in the Allan variance of fluctuations can be used to determine the lifetime. As a simple, classical test system, we utilize a nonlinear Kerr resonator driven into parametric oscillations regime, whose stable solutions mimic the physics of a single spin. We also provide an outlook of how our methods can be used to study Kramer's turnover in the synthetic quasi-potential of a parametric oscillator.
*Research was supported by the Swiss National Science Foundation under grants CRSII5 177198/1 and PP00P2 163818.
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Presenters
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Deividas Sabonis
- ETH Zurich
- Center for Quantum Devices, Niels Bohr Institute, University of Copenhagen, Universitetsparken 5, 2100 Copenhagen, Denmark, Laboratory for Solid State Physics, ETH Zürich