Characterization of niobium films with varying RRR values at low temperatures.
POSTER
Abstract
Niobium films are used both in microscopic superconducting qubits for quantum computing and in macroscopic SRF cavities for particle accelerators. Superconducting properties of niobium in microwave fields vary significantly with lattice defects and impurity content, where sub-at.% impurity level can reduce or increase microwave surface resistance by an order of magnitude. We studied the microwave properties of niobium films, deposited by different physical vapor deposition techniques, at low microwave fields correlating microwave properties at dilution fridge temperatures with material properties characterized with surface science techniques.
*This material is based upon work supported by the U.S. Department of Energy, Office of Science, National Quantum Information Science Research Centers, Superconducting Quantum Materials and Systems Center (SQMS) under contract number DE-AC02-07CH11359.
Presenters
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Bektur Abdisatarov
- Western Kentucky University
- Old Dominion University