Single Atom X-ray Spectroscopy using Synchrotron X-rays Scanning Tunneling Microscopy
ORAL
Abstract
X-rays are produced by excitations of the core level electrons in atoms, and they are useful to detect the type of elements in the periodic table. However, X-ray characterization generally requires a large number of atoms to attain a detectable signal and reducing the size of a sample for X-ray experiments is a long-time goal. To date, X-ray detection of materials can be made on the samples with as few as ~104 atoms due to advances in instrumentation. Here, we show that X-rays can be used to detect metal atoms at the ultimate atomic limit in a quantum tunnelling regime: A single iron atom caged in an organic host, a hexagonal shape supramolecule, has been detected using synchrotron X-ray scanning tunneling microscopy. The experiments were conducted at the XTIP beamline [1] located at the sector 4-ID-E of the Advanced Photon Source of Argonne National Laboratory. Using a specialized coaxial tip positioned at the extreme proximity to the molecule as a detector, the photocurrent generated from the synchrotron X-ray excitation of the iron atom is recorded. The fingerprints of the iron atom, the L3 and L2 edge signals at 708.9 eV and 722.1 eV energies originating from the 2p 3/2 and 2p ½ to ‘d’ transitions, are directly observed in the X-ray absorption spectra.
[1] V. Rose, N. Shirato, M. Bartlein, A. Deriy, T. Ajayi, D. Rosenmann, S.-W. Hla, M. Fisher, and R. Reininger. XTIP – the world's first beamline dedicated to the synchrotron X-ray scanning tunneling microscopy technique. J. Synchrotron Rad. 27, 836-843 (2020).
[1] V. Rose, N. Shirato, M. Bartlein, A. Deriy, T. Ajayi, D. Rosenmann, S.-W. Hla, M. Fisher, and R. Reininger. XTIP – the world's first beamline dedicated to the synchrotron X-ray scanning tunneling microscopy technique. J. Synchrotron Rad. 27, 836-843 (2020).
*This work was supported by the U. S. Department of Energy, Office of Science, Basic Energy Sciences, Materials Science and Engineering Division. Use of the Center for Nanoscale Materials, an Office of Science user facility, was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357.
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Presenters
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Tolulope Michael M Ajayi
- Ohio University
- Ohio University & Argonne National Laboratory