Microscopy 1: Electrons, THz, Optical
FOCUS · Q31 · ID: 48276
Presentations
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New Approaches to Atomic-Resolution Structural Analysis by Analytical Scanning Transmission Electron Microscopy
ORAL · Invited
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Presenters
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Robert F Klie
- University of Illinois at Chicago
- University of Illinois Chicago
Authors
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Robert F Klie
- University of Illinois at Chicago
- University of Illinois Chicago
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Scanning Transmission Electron Microscopy based Atomic Scale Fabrication Enhanced by In-operando Optical and Thermal Excitation
ORAL
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Presenters
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Stephen Jesse
- Oak Ridge National Laboratory
- University of Tennessee
Authors
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Stephen Jesse
- Oak Ridge National Laboratory
- University of Tennessee
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Ondrej Dyck
- ORNL
- Oak Ridge National Laboratory
- Oak Ridge National Lab
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Andrew R Lupini
- Oak Ridge National Lab
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Mapping conductivity with secondary electron EBIC in a STEM
ORAL
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Publication: O. Dyck, J. L. Swett, A. R. Lupini, J. A. Mol, and S. Jesse, "Imaging Secondary Electron Emission from a Single Atomic Layer," Small Methods, vol. 5, no. 4, p. 2000950, 2021, doi: 10.1002/smtd.202000950.
O. Dyck, J. L. Swett, C. Evangeli, A. R. Lupini, J. A. Mol, and S. Jesse, Mapping Conductance and Switching Behavior of Graphene Devices In Situ, Small Methods (under review)
O. Dyck, J. L. Swett, C. Evangeli, A. R. Lupini, J. A. Mol, and S. Jesse, Contrast mechanisms in secondary electron e-beam induced current (SEEBIC) imaging, (in progress)Presenters
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Ondrej Dyck
- ORNL
- Oak Ridge National Laboratory
- Oak Ridge National Lab
Authors
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Ondrej Dyck
- ORNL
- Oak Ridge National Laboratory
- Oak Ridge National Lab
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Jacob Swett
- ASU
- Arizona State University
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Charalambos Evangeli
- Oxford University
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Andrew R Lupini
- Oak Ridge National Lab
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Jan Mol
- Queen Mary University of London
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Stephen Jesse
- Oak Ridge National Laboratory
- University of Tennessee
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Enhancing Symmetry Breaking Defects in Materials with a STEM Phase Plate
ORAL
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Presenters
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Stephanie M Ribet
- Department of Materials Science and Engineering, Northwestern University; International Institute of Nanotechnology, Northwestern University
- Northwestern University
Authors
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Stephanie M Ribet
- Department of Materials Science and Engineering, Northwestern University; International Institute of Nanotechnology, Northwestern University
- Northwestern University
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Colin L Ophus
- National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory
- Lawrence Berkeley National Laboratory
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Vinayak P Dravid
- Northwestern University
- Department of Materials Science and Engineering, Northwestern University; International Institute of Nanotechnology, Northwestern University; NUANCE Center, Northwestern U.
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Roberto dos Reis
- Department of Materials Science and Engineering, Northwestern University; NUANCE Center, Northwestern University
- Northwestern University
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Kinetic and thermodynamic measurements of the crystallization of phase change materials using transmission electron microscopy and nanocalorimetry
ORAL
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Publication: Isak McGieson, Victoriea L. Bird, Christopher M. Barr, Khalid Hattar, Bryan W. Reed, Joseph T. McKeown, Feng Yi, David A. LaVan, and M. K. Santala.
"Crystallization kinetics and thermodynamics of an Ag-In-Sb-Te phase change material using complementary in-situ microscopic techniques".
In: Journal of Materials Research (2021). submitted invited paper.Presenters
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Isak McGieson
- Oregon State University
Authors
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Isak McGieson
- Oregon State University
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Atomic scale direct-write dopant patterning on graphene
ORAL
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Presenters
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Andrew R Lupini
- Oak Ridge National Lab
Authors
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Andrew R Lupini
- Oak Ridge National Lab
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Ondrej Dyck
- ORNL
- Oak Ridge National Laboratory
- Oak Ridge National Lab
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Mina Yoon
- Oak Ridge National Lab
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Sergei V Kalinin
- Oak Ridge National Lab
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory
- Oak Ridge National Laboratory
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Jacob Swett
- ASU
- Arizona State University
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Stephen Jesse
- Oak Ridge National Laboratory
- University of Tennessee
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Terahertz microspectroscopy: far-field spectral fidelity degradation and recovery
ORAL
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Presenters
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Timothy Lafave
- State Univ of NY - Buffalo
Authors
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Timothy Lafave
- State Univ of NY - Buffalo
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Andrea G Markelz
- State Univ of NY - Buffalo
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Traceable localization in optical microscopy
ORAL
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Publication: arXiv:2106.10221
Presenters
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Craig R Copeland
- NIST
- National Institute of Standards and Technology
Authors
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Craig R Copeland
- NIST
- National Institute of Standards and Technology
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Ronald G Dixson
- National Institute of Standards and Technology
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Andrew C Madison
- National Institute of Standards and Tech
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Adam L Pintar
- National Institute of Standards and Technology
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B. Rob Ilic
- National Institute of Standards and Technology
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Samuel M Stavis
- National Institute of Standards and Technology
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Rapid simulations of hyperspectral near-field images of three-dimensional heterogeneous surfaces
ORAL
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Publication: Chen, Xinzhong, et al. "Rapid simulations of hyperspectral near-field images of three-dimensional heterogeneous surfaces." accepted by Opt. Express
Presenters
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Ziheng Yao
- State Univ of NY - Stony Brook
- Stony Brook University (SUNY)
Authors
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Xinzhong Chen
- Stony Brook University (SUNY)
- State Univ of NY - Stony Brook
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Ziheng Yao
- State Univ of NY - Stony Brook
- Stony Brook University (SUNY)
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Stefan G Stanciu
- Politehnica University of Bucharest
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Dmitri N Basov
- Columbia University
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Rainer Hillenbrand
- CIC nanoGUNE
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Mengkun Liu
- State Univ of NY - Stony Brook
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Development of Image Corrections for Photoemission Electron Microscopy (PEEM) and its Application to Graphene
ORAL
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Publication: "Imaging and Measuring the Electronic Properties of Epitaxial Graphene with a Photoemission Electron Microscopy"
by Falk Niefind, Henry Bell, Thuc Mai, Angela Hight Walker, Randolph Elmquist, and Sujitra Pookpanratana (under review)Presenters
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Henry Bell
- National Institute of Standards and Technology and University of Maryland
- National Institute of Standards and Technology and Macalester College
Authors
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Henry Bell
- National Institute of Standards and Technology and University of Maryland
- National Institute of Standards and Technology and Macalester College
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Falk Niefind
- National Institute of Standards and Technology and University of Maryland
- National Institute of Standards and Technology and University of Maryland College Park
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Randolph E Elmquist
- National Institute of Standards and Technology
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Sujitra Pookpanratana
- National Institute of Standards and Tech
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Reconstruction of Nano-Plasmonic Excitations Using Ultrafast Transmission Electron Microscopy
ORAL
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Presenters
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John H Gaida
- Max Planck Institute for Biophysical Chemistry and 4th Physical Institute, University of Göttingen, 37077 Göttingen, Germany
Authors
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John H Gaida
- Max Planck Institute for Biophysical Chemistry and 4th Physical Institute, University of Göttingen, 37077 Göttingen, Germany
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Hugo Lourenço-Martins
- Max Planck Institute for Biophysical Chemistry and 4th Physical Institute, University of Göttingen, 37077 Göttingen, Germany
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Sergey Yalunin
- Max Planck Institute for Biophysical Chemistry and 4th Physical Institute, University of Göttingen, 37077 Göttingen, Germany
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Armin Feist
- Max Planck Institute for Biophysical Chemistry and 4th Physical Institute, University of Göttingen, 37077 Göttingen, Germany
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Murat Sivis
- Max Planck Institute for Biophysical Chemistry and 4th Physical Institute, University of Göttingen, 37077 Göttingen, Germany
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Thorsten Hohage
- Institute of Numerical and Applied Mathematics, University of Göttingen, 37083 Göttingen, Germany
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F. Javier García de Abajo
- ICFO-Institut de Ciencies Fotoniques and ICREA-Institució Catalana de Recerca i Estudis Avançats, Barcelona, Spain
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Claus Ropers
- Max Planck Institute for Biophysical Chemistry and 4th Physical Institute, University of Göttingen, 37077 Göttingen, Germany
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A scanning NV center magnetometry probe fabricated by a focused ion beam
ORAL
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Presenters
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Yuta Kainuma
- Japan Advanced Institute of Science and Technology
Authors
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Yuta Kainuma
- Japan Advanced Institute of Science and Technology
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Aoi Ideguchi
- Japan Advanced Institute of Science and Technology
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Kunitaka Hayashi
- Japan Advanced Institute of Science and Technology
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Toshu An
- Japan Advanced Institute of Science and Technology
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