Advances in scanned probe microscopy
ORAL · N31 · ID: 48294
Presentations
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UHV Compatible Negative Stiffness Vibrational Isolator for STM
ORAL
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Presenters
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Arnav Srivastava
- Harvard University
Authors
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Arnav Srivastava
- Harvard University
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Wan-Ting Liao
- Harvard University
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Jenny E Hoffman
- Harvard
- Harvard University
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Adding RF capabilities to a mK-STM for capacitance measurements
ORAL
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Presenters
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Michael Dreyer
- University of Maryland, College Park
Authors
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Michael Dreyer
- University of Maryland, College Park
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Jonathan J Marbey
- Laboratory for Physical Science
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Robert E Butera
- Laboratory for Physical Sciences
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Resolving nanoscale mechanical properties of multi-layered low-k dielectric films by contact resonance atomic force microscopy
ORAL
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Presenters
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Gheorghe Stan
- National Institute of Standards and Tech
Authors
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Gheorghe Stan
- National Institute of Standards and Tech
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Sean W King
- Intel Corporation, Hillsboro, Oregon 97124
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Characterizing Charged Defects in Oxide-on-Silicon using Kelvin Probe Force Microscopy
ORAL
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Presenters
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Leah Tom
- University of Wisconsin - Madison
Authors
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Leah Tom
- University of Wisconsin - Madison
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Zachary J Krebs
- University of Wisconsin - Madison
- University of Wisconsin-Madison
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Justin T White
- University of Wisconsin-Madison
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Wyatt A Behn
- University of Wisconsin - Madison
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Mark A Eriksson
- University of Wisconsin - Madison
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Victor W Brar
- University of Wisconsin - Madison
- Caltech
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Sue N Coppersmith
- University of New South Wales
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Mark G Friesen
- University of Wisconsin - Madison
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Using functionalized tips mounted on noncontact atomic force microscope to break chemical bonds within molecules – a computational perspective
ORAL
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Publication: Chen, P., Fan, D., Zhang, Y. et al. Breaking a dative bond with mechanical forces. Nat Commun 12, 5635 (2021). https://doi.org/10.1038/s41467-021-25932-6
Presenters
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Dingxin Fan
- University of Texas at Austin
Authors
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Dingxin Fan
- University of Texas at Austin
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James R Chelikowsky
- University of Texas at Austin
- Texas Center for Superconductivity and Department of Chemistry, University of Houston, Houston, TX 77204, USA
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Scanning Probe Microscopy Combined with Low Temperature Cryogen-free Operation in an Ultra-High Vacuum High Field Environment
ORAL
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Presenters
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Angela M Coe
- Rutgers University
Authors
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Angela M Coe
- Rutgers University
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Guohong Li
- Rutgers University, New Brunswick
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Eva Y Andrei
- Rutgers University
- Rutgers University, Department of Physics and Astronomy, 136 Frelinghuysen Rd, Piscataway, 08854, New Jersey, USA
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Scattering-Type Scanning Near-Field Optical Microscopy with Akiyama Piezo-Probes
ORAL
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Publication: M. Dapolito, X. Chen, C. Li, M. Tsuneto, S. Zhang, X. Du, M. Liu, and A. Gozar, "Scattering-type Scanning Near-field Optical Microscopy with Akiyama Piezo-Probes," Applied Physics Letters (2021) (submitted)
Presenters
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Michael Dapolito
- Stony Brook University (SUNY)
Authors
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Michael Dapolito
- Stony Brook University (SUNY)
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Xinzhong Chen
- Stony Brook University (SUNY)
- State Univ of NY - Stony Brook
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Chaoran Li
- Binghamton University
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Makoto Tsuneto
- Stony Brook University
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Shuai Zhang
- Columbia University
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Jennifer Cano
- Stony Brook University; Flatiron Institute
- Stony Brook University (SUNY) / Flatiron Institute
- State Univ of NY - Stony Brook
- Stony Brook University
- Stony Brook University (SUNY)
- Stony Brook University, Flatiron Institute
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Adrian Gozar
- Yale University
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Mengkun Liu
- State Univ of NY - Stony Brook
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Advanced numerical modeling of light-matter interactions at nanometer length scales
ORAL
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Presenters
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Haoyue Jiang
- College of William and Mary
- Department of Physics, College of William & Mary
Authors
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Haoyue Jiang
- College of William and Mary
- Department of Physics, College of William & Mary
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Patrick McArdle
- College of William & Mary
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David J Lahneman
- College of William and Mary
- Department of Physics, College of William & Mary
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M.Mumtaz Qazilbash
- College of William and Mary
- Department of Physics, College of William & Mary
- College of William & Mary
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Tetiana Slusar
- ETRI
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Hyun-Tak Kim
- ETRI
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Amlan Biswas
- University of Florida
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Jingyi Chen
- University of Arkansas
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Compensation of electrostatically-induced background in s-SNOM.
ORAL
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Publication: Tobias Nörenberg, Lukas Wehmeier, Denny Lang, Susanne C. Kehr, and Lukas M. Eng , "Compensating for artifacts in scanning near-field optical microscopy due to electrostatics", APL Photonics 6, 036102 (2021) https://doi.org/10.1063/5.0031395
Presenters
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Artem Danilov
- Attocube systems AG
Authors
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Artem Danilov
- Attocube systems AG
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Modifying plasmon resonances at nanocavities by molecular adsorption: A Scanning Tunnelling Microscopy Study
ORAL
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Presenters
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Óscar Jover Arrate
- Universidad Autónoma de Madrid
Authors
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Óscar Jover Arrate
- Universidad Autónoma de Madrid
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Koen Lauwaet
- IMDEA Nanoscience
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Roberto Otero
- Universidad Autónoma de Madrid; IMDEA Nanoscience
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Scanning Gradiometry of Magnetic and Electric Fields with a Single Nitrogen-Vacancy Sensor
ORAL
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Presenters
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William S Huxter
- ETH Zurich
Authors
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William S Huxter
- ETH Zurich
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Marius L Palm
- ETH Zurich
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Miranda L Davis
- ETH Zurich
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Christian L Degen
- ETH Zurich
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