Antisite defects stabilized by antiphase boundaries in multiferroic YFeO<sub>3</sub> thin films
ORAL
Abstract
Controlling the response of multiferroic materials to applied magnetic and electric fields necessitates knowledge of the defects present and their potential role in modifying behavior. In this presentation, we will report on the structure and chemistry of antiphase boundaries in Y-rich multiferroic YFeO3 thin films using aberration corrected scanning transmission electron microscopy and theory. Combining imaging with atomic resolution energy dispersive X-ray spectroscopy, we find that FeY antisites, which are not stable in the film bulk, periodically arrange along antiphase boundaries due to changes in the local structural environment. The impact that the point and planar defects will also be explored through theory. For example, using density functional theory, we will show that the antiphase boundaries are polar and bi-stable, where the presence of FeY antisites significantly decreases the switching barrier. Finally, we will discuss how these results highlight that planar defects, such as antiphase boundaries, can stabilize point defects that would otherwise not be expected to form within the structure.
*JML and AK acknowledge support of this work through the John Chipman Career Development Professorship and the MIT Mathworks engineering fellowship. The DFT calculations were carried out using the Extreme Science and Engineering Discovery Environment (XSEDE), which is supported by National Science Foundation Grant No. ACI1548562. The thin film growth was supported by the MRSEC Program of the National Science Foundation under award No.~DMR-1419807. CAR acknowledges support of SMART, an nCORE Center of the Semiconductor Research Corporation. The NVIDIA Titan Xp GPU used for this research was donated by the NVIDIA Corporation. This work was carried out in part through the use of the MIT Characterization.nano facility.
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Publication:Abinash Kumar, Konstantin Klyukin, Shuai Ning, Cigdem Ozsoy-Keskinbora, Mikhail Ovsyanko, Felix van Uden, Ruud Krijnen, Bilge Yildiz, Caroline A. Ross, James M. LeBeau, Antisite defects stabilized by antiphase boundaries in YFeO3 thin films. arXiv:2107.09152 (2021).
Presenters
James M LeBeau
Massachusetts Institute of Technology
Department of Materials Science & Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
Authors
James M LeBeau
Massachusetts Institute of Technology
Department of Materials Science & Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA