Effects of Boron diffusion on the surface Néel temperature revealed by magnetotransport and cold neutron depth profiling in B-doped Cr<sub>2</sub>O<sub>3</sub> films

ORAL

Abstract

Multi-functional thin films of boron (B) doped Cr2O3 grown by pulsed laser deposition exhibit voltage-controlled and nonvolatile Néel vector reorientation in the absence of a magnetic field. Isothermal toggling of antiferromagnetic states is demonstrated in prototype device structures at CMOS compatible temperatures between 300 and 400 K. Although isothermal switching is achieved, selecting a single domain state via a magnetoelectric annealing protocol is hampered most likely by a thermally activated runaway effect of the Néel temperature. This behavior can be understood by considering B diffusion within the thin Cr2O3 film. Cold Neutron Depth Profiling (cNDP), performed at National Institute of Standards and Technology, points at progressing depletion of B atoms in the bulk with temperature. At the same time the B-concentration increases near the surface. The Spin Hall measurements, sensitive to the surface magnetic state, indicate a shift in TN towards higher values associated with the increase in B-concentration near the film surface.

*Financial support by NSF/EPSCoR RII Track-1: Emergent Quantum Materials and Technologies, OIA-2044049 is acknowledged. The research was performed in part in the NNF: NNCI and the NCMN, supported by NSF under ECCS:2025208, and the NRI

Publication: Voltage controlled Néel vector rotation in zero magnetic field
Ather Mahmood Will Echtenkamp, Mike Street, Jun-Lei Wang, Shi Cao, Takashi Komesu, Peter A. Dowben, Pratyush Buragohain, Haidong Lu, Alexei Gruverman, Arun Parthasarathy, Shaloo Rakheja, Christian Binek. Nat Commun 12, 1674 (2021).

Presenters

  • Ather Mahmood

    • University of Nebraska - Lincoln

Authors

  • Syed Qamar Abbas Shah

    • University of Nebraska - Lincoln
  • Ather Mahmood

    • University of Nebraska - Lincoln
  • Will Echtenkamp

    • University of Nebraska - Lincoln
  • Jamie L Weaver

    • National Institute of Standards and Technology
    • Material Measurement Laboratory, National Institute of Standards and Technology
  • Jeffrey W Lynn

    • National Institute of Standards and Tech
    • National Institute of Standards and Technology
  • Christian Binek

    • University of Nebraska - Lincoln