Angstom-resolved Interfacial Structure in Organic-Inorganic Junctions
ORAL
Abstract
Charge transport processes at interfaces play a crucial role in many processes. Here, the first soft x-ray second harmonic generation (SXR SHG) interfacial spectrum of a buried interface (boron–Parylene N) is reported. SXR SHG shows distinct spectral features that are not observed in x-ray absorption spectra, demonstrating its extraordinary interfacial sensitivity. Comparison to electronic structure calculations indicates a boron-organic separation distance of 1.9 Å, with changes of less than 1 Å resulting in easily detectable SXR SHG spectral shifts (ca. hundreds of milli-electron volts).
*Supported by the Office of Science, Office of Basic Energy Sciences, Division of Chemical Sciences, Geosciences, and Biosciences of the U.S. Department of Energy at the Lawrence Berkeley National Laboratory (LBNL) under Contract No. DE-AC02-05CH11231.
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Publication: Schwartz, C. P., Raj, S. L., Jamnuch, S., Hull, C. J., Miotti, P., Lam, R. K., Nordlund, D., Uzundal, C. B., Pemmaraju, C. D., Mincigrucci, R., Foglia, L., Simoncig, A., Coreno, M., Masciovecchio, C., Gianessi, L., Poletto, L., Principi, E., Zuerch, M., Pascal, T. A., Drisdell, W. S., Saykally, R. J. "Angstom-resolved Interfacial Structure in Organic-Inorganic Junctions" Phys. Rev. Lett 127, 096801 (2021).
Presenters
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Craig Schwartz
- UNLV