Process Optimization for Superconducting Resonators via Identification and Mitigation of Interface Loss Mechanisms
ORAL
Abstract
CPW resonators plays a vital role for many quantum circuits. They also serve as a platform to characterize loss mechanisms in superconducting materials in the microwave frequency range. We report on the characterization and iterative process development of niobium-based CPW resonators. Using a set of post-fabrication chemical etching techniques, we have systematically reduced the metal-air and substrate-air oxide thickness, improving the device quality factor beyond 5 million at single-photon-excitation power (measured at 100 mK). Following these low temperature electrical measurements, resonator samples have been probed using a suite of structural characterization tools (XPS, TEM and AFM) in order to determine the thickness, chemical composition and location of parasitic interface layers and their contribution towards quality factor.
*This work was supported by the U.S. Department of Energy, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division under Contract No. DE-AC02-05-CH11231 within the QISLBNL program.
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Presenters
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Archan Banerjee
- Lawrence Berkeley National Laboratory
- University of California, Berkeley