Structural changes during drying of nano-aggregated inks

ORAL

Abstract

With increasing concentration above the overlap concentration, nanoaggregates become entwined and structural information at scales larger than an emergent mesh size are obscured. When observed in small-angle scattering, this is termed structural screening and is observed in the low-q regime. While observed as a function of concentration in solutions, structural screening is also apparent on relatively thick dried nano-aggregate layers such as in a dried ink plaque or a paint chip. In addition to this screening effect, emergent micron-scale network structures are often observed. These micron-scale structures may be responsible for optical properties in pigments and mechanical properties in reinforced elastomers. In investigating thin printed layers of nanoparticles, it was found that the impact of structural screening on the measurement of aggregate structures can be minimized in thin samples such as inkjet-printed layers of nano-aggregates with thicknesses on the order of less than 100 times the nano-aggregate size.

*This work was supported by the NSF[NSF CMMI 1635865]; the Argonne national lab [APS DOE DE-AC02-06CH1135]

Presenters

  • jianqi wang

    • Chemical and Materials Engineering, University of Cincinnati

Authors

  • jianqi wang

    • Chemical and Materials Engineering, University of Cincinnati
  • Kabir Rishi

    • Chemical and Materials Engineering, University of Cincinnati
    • University Of Cincinnati
    • Dept. Chem. and Mat. Eng., University of Cincinnati
    • University of Cincinnati
  • Greg Beaucage

    • Chemical and Materials Engineering, University of Cincinnati
    • University Of Cincinnati
    • Dept. Chem. and Mat. Eng., University of Cincinnati
    • University of Cincinnati
  • Ivan Kuzmenko

    • Argonne National Laboratory
    • Argonne National Lab
    • Advanced Photon Source, Argonne National Laboratory