Entanglement negativity at the critical point of measurement-driven transition

We study the entanglement behavior of a random unitary circuit punctuated by projective measurements at the measurement-driven phase transition in one spatial dimension. We numerically study the logarithmic entanglement negativity of two disjoint intervals and find that it scales as a power of the cross-ratio. We investigate two systems: (1) Clifford circuits with projective measurements, and (2) Haar random local unitary circuit with projective measurements. Previous results of entanglement entropy and mutual information point to an emergent conformal invariance of the measurement-induced transition. Remarkably, we identify a power-law behavior of entanglement negativity at the critical point, suggesting that the critical behavior of the measurement-induced transition cannot be described by any unitary conformal field theory.