Combined-Extreme In-Situ Experiments by Redesign of a Transmission Electron Microscope Pole-Piece Gap

 · Invited

Abstract

In-situ transmission electron microscopy (TEM) has allowed for site-specific probing of reactions and transformations with atomic-scale spatial resolution and ultrafast temporal resolution that can be coupled with quantitative property measurements. In moving toward operando experiments, more detector access and environmental control over the specimen is required to understand nanoscale mechanisms in complex environments. Currently, commercial TEM’s provide a limited number of access ports to the pole piece gap where the specimen resides, therefore commonly in-situ stimuli and property measurements are integrated into a side entry specimen holder. Side entry holders have stability and steric limitations that prevent many feedthroughs to be combined on one holder. Therefore, our redesign of the TEM pole piece gap provides enhanced manipulation of the specimen, integrated stimuli introduction, quantitative property measurements (temperature, strain, and current), and increased spatial accessibility for signal detection (backscattered electrons, x-rays, and light). This redesign includes a cartridge holder and an objective lens chamber for optimized specimen control and signal detection for studying materials under combined environmental extremes within a TEM.

*This work was funded by Sandia National Laboratories’ Laboratory Directed Research and Development program. It was performed, in part, at the Center for Integrated Nanotechnologies, an Office of Science User Facility operated for the U.S. Department of Energy (DOE) Office of Science. Sandia National Laboratories is a multi-mission laboratory managed and operated by National Technology and Engineering Solutions of Sandia, LLC., a wholly owned subsidiary of Honeywell International, Inc., for the U.S. DOE’s National Nuclear Security Administration under contract DE-NA-0003525. The views expressed in the article do not necessarily represent the views of the U.S. DOE or the United States Government.

Presenters

  • Zachary Milne

    • Sandia National Laboratories

Authors

  • Zachary Milne

    • Sandia National Laboratories
  • Katherine Jungjohann

    • Sandia National Laboratories
  • Khalid Hattar

    • Sandia National Laboratories