Membrane-based scanning force microscopy

ORAL

Abstract

We report the development of a scanning force microscope based on an ultra-sensitive silicon nitride membrane optomechanical transducer. Our development is made possible by inverting the standard microscope geometry - in our instrument, the substrate is vibrating and the scanning tip is at rest. We present first topography images of samples placed on the membrane surface. Our measurements demonstrate that the membrane retains an excellent force sensitivity when loaded with samples and in the presence of a scanning tip. We discuss the prospects and limitations of our instrument as a quantum-limited force sensor and imaging tool.

*This work was supported by SNSF: NCCR QSIT, CRSII5_177198/1, 200020-178863; DNRF Hy-Q; ERC Starting Grants NANOMRI (309301), Q-CEOM (638765); ERC grant ULTRAFORS(825797); Marie-Curie Fellowship Nano-MRI (325866) and ETH research grant (ETH-03 16-1).

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Presenters

  • David Hälg

    • Department of Physics, ETH Zurich

Authors

  • David Hälg

    • Department of Physics, ETH Zurich

  • Thomas Gisler

    • Department of Physics, ETH Zurich

  • Yeghishe Tsaturyan

    • Niels Bohr Institute, University of Copenhagen

  • Catalini Letizia

    • Niels Bohr Institute, University of Copenhagen

  • Urs Grob

    • Department of Physics, ETH Zurich

  • Marc-Dominik Krass

    • Department of Physics, ETH Zurich

  • Martin Héritier

    • Department of Physics, ETH Zurich

  • Hinrich Mattiat

    • Physics, University of Basel

  • Ann-Katrin Thamm

    • Department of Physics, ETH Zurich

  • Romana Schirhagl

    • Biomedical Engineering, Groningen University

  • Eric Christopher Langman

    • Niels Bohr Institute, University of Copenhagen

  • Albert Schliesser

    • Niels Bohr Institute, University of Copenhagen

  • Christian Degen

    • Department of Physics, ETH Zurich

  • Alexander Eichler

    • Department of Physics, ETH Zurich
    • ETH Zurich