Probing the electric-field noise induced by dielectric surfaces using a trapped ion

In ion traps with integrated fiber cavities ions are placed in close proximity of a dielectric surface. Dielectric layers on top of the metallic trap electrodes are known to lead to heating of trapped ions [1]. However, the influence of bulk dielectric structures on an ion has not yet been shown experimentally.
I will present a method that predicts the influence of any dielectric structure on a nearby ion. I will discuss its application to our experimental apparatus, which incorporates a microscopic fiber cavity, and compare predictions with experimental results. In the future, our method can be used to guide the design process of distributed ion-trap-based quantum computers and network nodes.
[1] M. Kumph et al., New J. of Phys. 18 (2016)