Electronic structure of VTe<sub>2</sub> thin films studied by high-resolution ARPES

ORAL

Abstract

Atomically-thin transition metal dichalcogenides are a target of intensive studies since they show variety of exotic physical properties such as robust charge-density-waves (CDW) and two-dimensional superconductivity. We have fabricated monolayer and multilayer VTe2 thin films on bilayer graphene by molecular-beam-epitaxy method and studied their electronic states by angle-resolved photoemission spectroscopy. We clearly found a drastic difference in the Fermi-surface topology between monolayer and multilayer VTe2 films, suggesting an occurrence of structural phase transition from regular octahedral (1T) to distorted octahedral (1T') phase. We discuss the origin of structural phase transition in terms of the CDW and Jahn-Teller effect.

*This work was supported by JST-CREST (No. JPMJCR18T1), JSPS KAKENHI Grants (Nos. JP18H01821, JP18H01160 and JP17H01139), KEK-PF (Proposal No. 2018S2-001), Science research projects from Shimazu Science Foundation, World Premier International Research Center, Advanced Institute for Materials Research. T. K. acknowledges support from GP-Spin at Tohoku University.

Presenters

  • Tappei Kawakami

    • Department of Physics, Tohoku University

Authors

  • Tappei Kawakami

    • Department of Physics, Tohoku University
  • Takemi Kato

    • Department of Physics, Tohoku University
  • Katsuaki Sugawara

    • Department of Physics, Tohoku University
  • Taiki Taguchi

    • Department of Physics, Tohoku University
  • Yasuaki Saruta

    • Department of Physics, Tohoku University
  • Takafumi Sato

    • Department of Physics, Tohoku University