Developments in Reflectivity for Thin Film Characterization
FOCUS · E02 · ID: 380808
Presentations
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Solvent vapor annealing of diblock copolymer thin films with a solvent mixture
Invited
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Presenters
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Christine Papadakis
- Technical University of Munich
- TU Munich
Authors
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Christine Papadakis
- Technical University of Munich
- TU Munich
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Florian A. Jung
- TU Munich
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Anatoly V. Berezkin
- TU Munich
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Dorthe Posselt
- IMFUFA, Fepartment of Science and the Environment, Roskilde University
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Detlef M Smilgies
- Cornell High Energy Synchrotron Source (CHESS), Wilson Laboratory, Cornell University
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Introducing the CANDOR polychromatic reflectometer
ORAL
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Presenters
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David Hoogerheide
- National Institute of Standards and Technology
Authors
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David Hoogerheide
- National Institute of Standards and Technology
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Alexander Grutter
- National Institute of Standards and Technology
- Center for Neutron Research, National Institute of Standards and Technology
- NIST Center for Neutron Research, NIST
- NIST Gaithersburg
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Brian Maranville
- National Institute of Standards and Technology
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Charles Majkrzak
- National Institute of Standards and Technology
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Characterization of anisotropic organic layered films by resonant soft x-ray reflectivity
ORAL
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Presenters
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Luca Pasquali
- Università di Modena e Reggio Emilia
- University of Modena & Reggio Emilia
Authors
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Luca Pasquali
- Università di Modena e Reggio Emilia
- University of Modena & Reggio Emilia
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Raffaella Capelli
- University of Modena & Reggio Emilia
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Matteo Bonfatti
- University of Modena & Reggio Emilia
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Francesco Mezzadri
- University of Modena & Reggio Emilia
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Emanuele Galligani
- University of Modena & Reggio Emilia
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Adriano Verna
- University of Roma Tre
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Alessandro Ruocco
- University of Roma Tre
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Nicola Mahne
- CNR-IOM
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Stefano Nannarone
- CNR-IOM
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Probing Buried Interfaces in Polymers with Soft X-ray Reflectivity
ORAL
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Presenters
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Daniel Sunday
- National Institute of Standards and Technology
- National Institute for Standards and Technology
Authors
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Daniel Sunday
- National Institute of Standards and Technology
- National Institute for Standards and Technology
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Jacob L Thelen
- National Institute of Standards and Technology
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Chun Zhou
- Institute for Molecular Engineering, University of Chicago
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Jiaxing Ren
- Institute for Molecular Engineering, University of Chicago
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R. Joseph Kline
- National Institute of Standards and Technology
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Paul F Nealey
- Molecular Engineering, University of Chicago
- Pritzker School of Molecular Engineering, University of Chicago
- University of Chicago
- Institute for Molecular Engineering, University of Chicago
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Development of spin-contrast-variation neutron reflectometry for structural analysis of multilayer films
ORAL
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Presenters
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Takayuki Kumada
- Japan Atomic Energy Agency
Authors
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Takayuki Kumada
- Japan Atomic Energy Agency
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Kazuhiro Akutsu
- Neutron Science and Technology Center, Comprehensive Research Organization for Science and Society
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Daisuke Miura
- Department of Physics, Yamagata University
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Jun-ichi Suzuki
- Neutron Science and Technology Center, Comprehensive Research Organization for Science and Society
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Naoya Torikai
- Graduate School of Engineering, Mie University
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Information Content and Experimental Design in Neutron Reflectometry
Invited
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Presenters
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Frank Heinrich
- Department of Physics, Carnegie Mellon University
Authors
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Frank Heinrich
- Department of Physics, Carnegie Mellon University
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Determining Lamellar Structure with Soft X-ray Reflectivity
ORAL
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Presenters
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Whitney Loo
- University of California, Berkeley
- University of Chicago
- Chemical and Biomolecular Engineering, University of California, Berkeley
Authors
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Whitney Loo
- University of California, Berkeley
- University of Chicago
- Chemical and Biomolecular Engineering, University of California, Berkeley
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Hongbo Feng
- Molecular Engineering, University of Chicago
- University of Chicago
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Daniel Sunday
- National Institute of Standards and Technology
- National Institute for Standards and Technology
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Paul F Nealey
- Molecular Engineering, University of Chicago
- Pritzker School of Molecular Engineering, University of Chicago
- University of Chicago
- Institute for Molecular Engineering, University of Chicago
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Depth profiling molecular orientation with polarized resonant soft X-ray reflectivity
ORAL
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Presenters
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Thomas Ferron
- National Institute of Standards and Technology
- Physics and Astronomy, Washington State University
- Washington State Univ
Authors
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Thomas Ferron
- National Institute of Standards and Technology
- Physics and Astronomy, Washington State University
- Washington State Univ
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Jacob L Thelen
- National Institute of Standards and Technology
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Kushal Bagchi
- University of Wisconsin - Madison
- Department of Chemistry, University of Wisconsin-Madison
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Marie Fiori
- University of Wisconsin - Madison
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Mark Ediger
- University of Wisconsin - Madison
- Department of Chemistry, University of Wisconsin-Madison
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Dean DeLongchamp
- National Institute of Standards and Technology
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Daniel Sunday
- National Institute of Standards and Technology
- National Institute for Standards and Technology
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Probing interactions at the polymer thin film/substrate interface using Kelvin probe force microscopy
ORAL
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Presenters
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Jill Wenderott
- Northwestern University
Authors
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Jill Wenderott
- Northwestern University
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Ban Dong
- University of Chicago
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Jojo Amonoo
- University of Michigan
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Peter F Green
- National Renewable Energy Laboratory
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