Optimal Boron Thickness in a NISC

ORAL

Abstract

A neutron intercepting silicon chip (NISC) comprises a silicon data storage chip coated with a layer of borophosphosilicate glass (BPSG) containing boron-10. Neutrons interact in the boron layer via neutron capture: n + B-10 -> Li-7 + He-4. The ions produced deposit charge (on the order of fC/um) over a range of several microns; when one of them passes through the data-storing oxide-nitride-oxide (ONO) layer of the chip, the charge it deposits causes a leakage across capacitors in the chip, and as a result bits flip from positive to negative. In the interests of optimizing the thickness of the boron layer, a Monte Carlo program has been written to simulate the paths of particles and their charge deposits in the charge-storing layer. The simulation shows that a significant advantage in efficiency can likely be gained by increasing the thickness of the boron layer by an order of magnitude.

*Funded by STTR Phase II award from USAF agreement number FA-8649-20-9-9040

Presenters

  • John Rabaey

    • University of Dallas

Authors

  • John Rabaey

    • University of Dallas
  • Steven Block

    • University of Dallas
  • Will H Flanagan

    • University of Dallas
  • Clayton Fullwood

    • Cerium Labs
    • Cerium labs
  • Peter Hedlesky

    • University of Dallas
  • Tim Hossain

    • Cerium Labs
    • Cerium labs
  • Aidan Medcalf

    • University of Dallas
  • Mark Clopton

    • Cerium Labs
    • Cerium labs
  • Tracy Tipping

    • Cerium Labs
    • Nuclear and Radiation Engineering, University of Texas at Austin
  • Peter Niles

    • University of Dallas