Reflectometry of charge transitions in a silicon quadruple dot

ORAL

Abstract

Silicon is considered a promising candidate for realizing large qubit processors [1], making quantum dots in silicon nanowire transistors, fabricated in industrial cleanrooms on 300-mm wafers, particularly attractive [2]. We perform gate-based reflectometry measurements of various charge states in a foundry-fabricated two-dimensional quadruple quantum dot. From a wiring perspective, the low number of control channels (one gate-electrode per dot and global top and back gates) is desirable, provided that tunnel couplings are adjustable to allow controlled single-electron movements [3] and single-shot reflectometry readout.
Using native and virtual gate voltages, we demonstrate charge sensing and dispersive read-out down to the last electron in each dot, and show an adjustability of interdot tunneling rates using the top gate. We support our findings with k x p modeling and simulations based on a constant interaction model, and experimentally demonstrate single-shot detection of interdot charge transitions with unity signal-to-noise ratios at bandwidths exceeding 1 MHz.
[1] Vandersypen et al., npj Quant.Inf. 3, 34 (2017)
[2] Maurand et al., Nat.Comm. 7, 13575 (2016)
[3] Ansaloni et al., arXiv:2004.00894 (2020)

*We acknowledge fundings from the EU's grants No. 688539, 676108, and 323841.

Presenters

  • Heorhii Bohuslavskyi

    • Univ of Copenhagen
    • Center for Quantum Devices, Niels Bohr Institute, University of Copenhagen, 2100 Copenhagen, Denmark

Authors

  • Heorhii Bohuslavskyi

    • Univ of Copenhagen
    • Center for Quantum Devices, Niels Bohr Institute, University of Copenhagen, 2100 Copenhagen, Denmark
  • Fabio Ansaloni

    • Univ of Copenhagen
    • Center for Quantum Devices, Niels Bohr Institute, University of Copenhagen, 2100 Copenhagen, Denmark
  • Anasua Chatterjee

    • Univ of Copenhagen
    • Center for Quantum Devices, Niels Bohr Institute, University of Copenhagen, 2100 Copenhagen, Denmark
  • Federico Fedele

    • Univ of Copenhagen
    • Center for Quantum Devices, Niels Bohr Institute, University of Copenhagen, 2100 Copenhagen, Denmark
  • Torbjørn Rasmussen

    • Univ of Copenhagen
    • Center for Quantum Devices, Niels Bohr Institute, University of Copenhagen, 2100 Copenhagen, Denmark
  • Bertram Brovang

    • Univ of Copenhagen
    • Center for Quantum Devices, Niels Bohr Institute, University of Copenhagen, 2100 Copenhagen, Denmark
  • Jing LI

    • Université Grenoble Alpes, CEA, IRIG, MEM/L_Sim
    • Univ. Grenoble Alpes, CEA, IRIG-MEM-L Sim, F-38000, Grenoble, France
    • CEA, LETI, Minatec Campus, F-38054 Grenoble, France
  • Louis HUTIN

    • CEA/LETI-MINATEC, CEA-Grenoble
    • CEA Leti
    • CEA, Grenoble
    • CEA, LETI, Minatec Campus, F-38054 Grenoble, France
  • Benjamin Venitucci

    • Université Grenoble Alpes, CEA, IRIG, MEM-L Sim, F-38000 Grenoble, France
  • Benoit Bertrand

    • Leti, CEA
    • CEA/LETI-MINATEC, CEA-Grenoble
    • CEA, Grenoble
    • CEA, LETI, Minatec Campus, F-38054 Grenoble, France
  • Maud Vinet

    • Leti, CEA
    • CEA/LETI-MINATEC, CEA-Grenoble
    • CEA Leti
    • CEA, Grenoble
    • CEA, LETI, Minatec Campus, F-38054 Grenoble, France
  • Yann-Michel Niquet

    • Université Grenoble Alpes, CEA, IRIG, MEM/L_Sim
    • Univ. Grenoble Alpes, CEA, IRIG-MEM-L Sim, F-38000, Grenoble, France
    • Université Grenoble Alpes, CEA, IRIG, MEM-L Sim, F-38000 Grenoble, France
  • Ferdinand Kuemmeth

    • Univ of Copenhagen
    • Center for Quantum Devices, Niels Bohr Institute, University of Copenhagen, 2100 Copenhagen, Denmark