Computing Nonradiative Capture Coefficients from First Principles
ORAL
Abstract
Semiconductor devices are susceptible to defect-mediated nonradiative processes that degrade their performance. In optoelectronic devices, for example, these nonradiative transitions give rise to Shockley-Read-Hall recombination that limits the light-emission efficiency. The nonradiative processes occur as a result of electron-phonon coupling, and a rigorous evaluation of the resulting rates is of vital importance for analysis and improvement of devices. We have developed the Nonrad code, which implements the first-principles formalism of Alkauskas et al. [1] for the evaluation of nonradiative capture coefficients. We will discuss several improvements to the methodology, including a treatment of electron-phonon coupling within the widely used projector augmented-wave method.
[1] A. Alkauskas, Q. Yan, and C. G. Van de Walle, Phys. Rev. B 90, 075202 (2014).
[1] A. Alkauskas, Q. Yan, and C. G. Van de Walle, Phys. Rev. B 90, 075202 (2014).
*This work is supported by DOE.
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Presenters
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Mark Turiansky
- University of California, Santa Barbara
- physics, University of California, Santa Barbara