Atomic resolution characterization of 2D materials with scanning transmission electron microscopy.

 · Invited

Abstract

Selected by Focus Topic Organizer (Liuyan Zhao, Robert Hovden).

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Presenters

  • Nasim Alem

    • Department of Materials Science and Engineering, Pennsylvania State University
    • Materials Science and Engineering, Penn State University

Authors

  • Nasim Alem

    • Department of Materials Science and Engineering, Pennsylvania State University
    • Materials Science and Engineering, Penn State University