Realization of Nanoscale Mapping of Noise Source Activities on Graphene Domains

ORAL

Abstract

We report a “noise spectral imaging” strategy to directly map the noise source activities in graphene domains. Here, the lateral current and noise maps were measured by scanning a conductive contact probe on the graphene surface. The measured data were analyzed by using a two-dimensional network model to obtain the sheet resistance and charge trap density maps inside graphene domains, on domain boundaries, and on the edge of graphene. The results showed high activities of noise sources and large sheet resistance values at the domain boundary and edge of graphene. Furthermore, the top layer of double-layer graphene was found to have lower noises than those of single-layer graphene, as predicted previously. Our method allows one to image the localized noise source distribution in two-dimensional electronic channels such as graphene, and thus it can be a powerful tool for the basic research and applications about two-dimensional transports in nanostructures.

*This work was supported by the National Research Foundation(NRF) Grant (No. 2013M3A6B2078961). B.H.H. thanks Graphene Resesarch Center at Advanced Institute of Convergence Technology. S.H. also acknowledges support from the NRF Grant (Nos. 2014M3A7B4051591 and 2015M3C1A3002152).

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Presenters

  • JEEHYE PARK

    • Department of Physics and Astronomy, and Institute of Applied Physics, Seoul National University, Seoul, 08826, Korea

Authors

  • JEEHYE PARK

    • Department of Physics and Astronomy, and Institute of Applied Physics, Seoul National University, Seoul, 08826, Korea

  • Hyungwoo Lee

    • Department of Physics and Astronomy, and Institute of Applied Physics, Seoul National University, Seoul, 08826, Korea

  • Duckhyung Cho

    • Department of Physics and Astronomy, and Institute of Applied Physics, Seoul National University, Seoul, 08826, Korea

  • Shashank Shekhar

    • Department of Physics and Astronomy, and Institute of Applied Physics, Seoul National University, Seoul, 08826, Korea

  • Jeongsu Kim

    • Department of Physics and Astronomy, and Institute of Applied Physics, Seoul National University, Seoul, 08826, Korea

  • Jaesung Park

    • Center for Electricity & Magnetism, Korea Research Institute of Standards and Science, Daejeon, 34125, Korea

  • Byung Hee Hong

    • Department of Chemistry, Seoul National University, Seoul, 08826, Korea

  • Seunghun Hong

    • Department of Physics and Astronomy, and Institute of Applied Physics, and Department of Biophysics and Chemical Biology, Seoul National University
    • Department of Physics and Astronomy, and Institute of Applied Physics, Seoul National University, Seoul, 08826, Korea